Inventor
OHMINAMI NOBUYUKI
JP4 patents
Patents
4 patentsUS7873432B2Jan 18, 2011
Manufacturing inspection/analysis system analyzing device, analyzing device control program, storage medium storing analyzing device control program, and method for manufacturing inspection and analysis
SHARP KK2 citations60
US7278587B2Oct 9, 2007
Thermal treatment apparatus and thermal treatment method
SHARP KK5 citations56
US6975102B2Dec 13, 2005
Apparatus and method for analyzing capacitance of insulator
SHARP KK3 citations56
US7515258B2Apr 7, 2009
Semiconductor device, and method and apparatus for inspecting appearance thereof
SHARP KK1 citations49