Inventor
UMEMOTO TAKESHI
JP29 patents
⚠️ This page may combine multiple inventors who share the name “UMEMOTO TAKESHI”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
NEC CORP
7 patentsUS6104086AAug 15, 2000
Semiconductor device having lead terminals bent in J-shape
NEC CORP167 citations98
US6242797B1Jun 5, 2001
Semiconductor device having pellet mounted on radiating plate thereof
NEC CORP31 citations92
US6175150B1Jan 16, 2001
Plastic-encapsulated semiconductor device and fabrication method thereof
NEC CORP18 citations81
US6319753B1Nov 20, 2001
Semiconductor device having lead terminals bent in J-shape
NEC CORP12 citations73
US6165818ADec 26, 2000
Method of manufacturing a semiconductor device with a pair of radiating terminals and a plurality of lead terminals formed from a single lead frame
NEC CORP7 citations73
US6150715ANov 21, 2000
Semiconductor device with radiation plate for high radiation character and method of manufacturing the same
NEC CORP14 citations73
US6177720B1Jan 23, 2001
Method of manufacturing a semiconductor device with a pair of radiating terminals and a plurality of lead terminals formed from a single lead frame
NEC CORP3 citations62
SHARP KK
5 patentsUS6765283B2Jul 20, 2004
Semiconductor device with multi-layer interlayer dielectric film
SHARP KK3 citations63
US6337270B2Jan 8, 2002
Process for manufacturing semiconductor device
SHARP KK6 citations63
US7873432B2Jan 18, 2011
Manufacturing inspection/analysis system analyzing device, analyzing device control program, storage medium storing analyzing device control program, and method for manufacturing inspection and analysis
SHARP KK2 citations60
US6848454B2Feb 1, 2005
Method of manufacturing semiconductor device
SHARP KK3 citations60
US7515258B2Apr 7, 2009
Semiconductor device, and method and apparatus for inspecting appearance thereof
SHARP KK1 citations49
YAMAHA MOTOR CO LTD
4 patentsSII NANOTECHNOLOGY INC
4 patentsUS7926328B2Apr 19, 2011
Sample manipulating apparatus
SII NANOTECHNOLOGY INC2 citations63
US7866205B2Jan 11, 2011
Sample operation apparatus
SII NANOTECHNOLOGY INC2 citations63
US7770474B2Aug 10, 2010
Sample operation apparatus
SII NANOTECHNOLOGY INC6 citations63
US7874016B2Jan 18, 2011
Scanning probe microscope and scanning method
SII NANOTECHNOLOGY INC0 citations40