Inventor · disambiguated record
Joanna Schmit
Also filed as: SCHMIT JOANNA
16 granted patents·368 citations·filing 1997–2015
94Inventor score
Top patents by PatentIndex Score
16 records- 0196US6624894B2Scanning interferometry with reference signalVEECO INSTR INC·Filed 2001·Granted Sep 23, 2003·98 cites·26 claims
- 0286US7119909B2Film thickness and boundary characterization by interferometric profilometryVEECO INSTR INC·Filed 2004·Granted Oct 10, 2006·39 cites·29 claims
- 0386US6987570B1Reference signal for stitching of interferometric profilesVEECO INSTR INC·Filed 2002·Granted Jan 17, 2006·30 cites·52 claims
- 0485US8072610B1Polarization mirau interference microscopeSCHMIT JOANNA·Filed 2008·Granted Dec 6, 2011·20 cites·19 claims
- 0584US9746315B1Side illumination in interferometrySCHMIT JOANNA·Filed 2015·Granted Aug 29, 2017·5 cites·8 claims
- 0682US6624893B1Correction of scanning errors in interferometric profilingVEECO INSTR INC·Filed 2001·Granted Sep 23, 2003·29 cites·27 claims
- 0780US9372079B1Optical plate for calibration of coordinate measuring machinesWU TAY-CHANG·Filed 2014·Granted Jun 21, 2016·13 cites·18 claims
- 0879US6493093B2Bat-wing attenuation in white-light interferometryVEECO INSTR INC·Filed 2001·Granted Dec 10, 2002·33 cites·17 claims
- 0976US5991461ASelection process for sequentially combining multiple sets of overlapping surface-profile interferometric data to produce a continuous composite mapVEECO CORP·Filed 1997·Granted Nov 23, 1999·70 cites·16 claims
- 1075US9282304B1Full-color images produced by white-light interferometrySCHMIT JOANNA·Filed 2014·Granted Mar 8, 2016·3 cites·26 claims
- 1171US8275573B1Large-surface defect detection by single-frame spatial-carrier interferometrySCHMIT JOANNA·Filed 2009·Granted Sep 25, 2012·7 cites·30 claims
- 1265US8953171B1Signal sectioning for profiling printed-circuit-board vias with vertical scanning interferometrySCHMIT JOANNA·Filed 2012·Granted Feb 10, 2015·2 cites·14 claims
- 1363US6847460B2Alignment and correction template for optical profilometric measurementVEECO INSTR INC·Filed 2002·Granted Jan 25, 2005·8 cites·33 claims
- 1461US7283250B2Measurement of object deformation with optical profilerVEECO INSTR INC·Filed 2004·Granted Oct 16, 2007·10 cites·18 claims
- 1553US9664509B2Signal sectioning for profiling printed-circuit-bord vias with vertical scanning interferometryBRUKER NANO INC·Filed 2014·Granted May 30, 2017·0 cites·6 claims
- 1651US7505863B2Interferometric iterative technique with bandwidth and numerical-aperture dependencyVEECO INSTR INC·Filed 2007·Granted Mar 17, 2009·1 cites·36 claims
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