Inventor
HUANG JUNQING
US16 patents
⚠️ This page may combine multiple inventors who share the name “HUANG JUNQING”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
KLA TENCOR CORP
10 patentsUS9053527B2Jun 9, 2015
Detecting defects on a wafer
KLA TENCOR CORP66 citations96
US9224660B2Dec 29, 2015
Tuning wafer inspection recipes using precise defect locations
KLA TENCOR CORP7 citations83
US11270430B2Mar 8, 2022
Wafer inspection using difference images
KLA TENCOR CORP5 citations72
US10599944B2Mar 24, 2020
Visual feedback for inspection algorithms and filters
KLA TENCOR CORP2 citations72
US10395359B2Aug 27, 2019
Adaptive local threshold and color filtering
KLA TENCOR CORP2 citations72
US9704234B2Jul 11, 2017
Adaptive local threshold and color filtering
KLA TENCOR CORP2 citations72
US9619876B2Apr 11, 2017
Detecting defects on wafers based on 2D scatter plots of values determined for output generated using different optics modes
KLA TENCOR CORP3 citations72
US9442077B2Sep 13, 2016
Scratch filter for wafer inspection
KLA TENCOR CORP1 citations51
US10600177B2Mar 24, 2020
Nuisance reduction using location-based attributes
KLA TENCOR CORP0 citations41
US10339262B2Jul 2, 2019
System and method for defining care areas in repeating structures of design data
KLA TENCOR CORP0 citations40