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Inventor
CHEUNG KIN P
US
9 patents
⚠️ This page may combine multiple inventors who share the name “CHEUNG KIN P”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
UNIV RUTGERS
1 patent
US6936494B2
Aug 30, 2005
Processes for hermetically packaging wafer level microscopic structures
UNIV RUTGERS
90 citations
95
AT & T BELL LAB
1 patent
US5008217A
Apr 16, 1991
Process for fabricating integrated circuits having shallow junctions
AT & T BELL LAB
23 citations
90
AGERE SYSTEMS INC
1 patent
US6524872B1
Feb 25, 2003
Using fast hot-carrier aging method for measuring plasma charging damage
AGERE SYSTEMS INC
16 citations
82
GOVERNMENT OF THE US SECRETARY OF COMMERCE
1 patent
US11507135B2
Nov 22, 2022
Molecular scrivener for reading or writing data to a macromolecule
GOVERNMENT OF THE US SECRETARY OF COMMERCE
6 citations
70
NAT INST OF STANDARDS & TECH
1 patent
US9507004B2
Nov 29, 2016
Electron spin resonance spectrometer and method for using same
NAT INST OF STANDARDS & TECH
3 citations
66
SEMATECH INC
1 patent
US7548067B2
Jun 16, 2009
Methods for measuring capacitance
SEMATECH INC
4 citations
58
AGERE SYST GUARDIAN CORP
1 patent
US6365426B1
Apr 2, 2002
Method of determining the impact of plasma-charging damage on yield and reliability in submicron integrated circuits
AGERE SYST GUARDIAN CORP
1 citations
48
US COMMERCE
1 patent
US10241149B2
Mar 26, 2019
Massively parallel wafer-level reliability system and process for massively parallel wafer-level reliability testing
US COMMERCE
0 citations
39
NATIONAL INSTITUTE OF STANDARDS AND TECH
1 patent
US10247814B2
Apr 2, 2019
Phase shift detector process for making and use of same
NATIONAL INSTITUTE OF STANDARDS AND TECH
0 citations
36