Inventor
PREIKSZAS DIRK
DE35 patents
⚠️ This page may combine multiple inventors who share the name “PREIKSZAS DIRK”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
ZEISS CARL MICROSCOPY GMBH
15 patentsUS11380519B1Jul 5, 2022
Operating a particle beam generator for a particle beam device
ZEISS CARL MICROSCOPY GMBH2 citations73
US9859092B2Jan 2, 2018
Particle beam microscope and method for operating a particle beam microscope
ZEISS CARL MICROSCOPY GMBH2 citations73
US10699869B2Jun 30, 2020
Operating a particle beam apparatus
ZEISS CARL MICROSCOPY GMBH3 citations71
US9953804B2Apr 24, 2018
High-voltage supply unit and circuit arrangement for generating a high voltage for a particle beam apparatus
ZEISS CARL MICROSCOPY GMBH5 citations69
US10546717B2Jan 28, 2020
High-voltage supply unit and circuit arrangement for generating a high voltage for a particle beam apparatus
ZEISS CARL MICROSCOPY GMBH1 citations59
US11087949B2Aug 10, 2021
Particle-optical apparatus and particle beam system
ZEISS CARL MICROSCOPY GMBH1 citations58
US10755889B2Aug 25, 2020
Particle-optical apparatus and particle beam system
ZEISS CARL MICROSCOPY GMBH1 citations58
US10062542B2Aug 28, 2018
Particle beam microscope and method for operating a particle beam microscope
ZEISS CARL MICROSCOPY GMBH1 citations52
US11915907B2Feb 27, 2024
Method for operating a particle beam microscope
ZEISS CARL MICROSCOPY GMBH0 citations50
US12288664B2Apr 29, 2025
Particle beam device having a deflection unit
ZEISS CARL MICROSCOPY GMBH0 citations49
US9312093B1Apr 12, 2016
Particle beam device comprising an electrode unit
ZEISS CARL MICROSCOPY GMBH1 citations47
US10665423B2May 26, 2020
Analyzing energy of charged particles
ZEISS CARL MICROSCOPY GMBH0 citations42
US10629404B2Apr 21, 2020
Method for adjusting a particle beam microscope
ZEISS CARL MICROSCOPY GMBH0 citations42
US9947504B2Apr 17, 2018
Particle beam apparatus and method for operating a particle beam apparatus
ZEISS CARL MICROSCOPY GMBH0 citations35
US10854421B2Dec 1, 2020
Charged particle beam system and method
ZEISS CARL MICROSCOPY GMBH0 citations32
PREIKSZAS DIRK
9 patentsUS8304750B2Nov 6, 2012
Scanning charged particle beams
PREIKSZAS DIRK51 citations92
US8129693B2Mar 6, 2012
Charged particle beam column and method of operating same
PREIKSZAS DIRK19 citations92
US8405045B2Mar 26, 2013
Particle beam device with deflection system
PREIKSZAS DIRK8 citations82
US11139140B2Oct 5, 2021
Particle beam apparatus having an aperture unit and method for setting a beam current in a particle beam apparatus
PREIKSZAS DIRK2 citations72
US9093246B2Jul 28, 2015
SACP method and particle optical system for performing the method
PREIKSZAS DIRK5 citations72
US8217350B2Jul 10, 2012
Particle optical arrangement
PREIKSZAS DIRK2 citations62
US8558190B2Oct 15, 2013
Charged particle beam column and method of operating same
PREIKSZAS DIRK0 citations51
US8421028B2Apr 16, 2013
Device for deflecting or guiding in a particle beam
PREIKSZAS DIRK1 citations51
US8063364B2Nov 22, 2011
Particle optical device with magnet assembly
PREIKSZAS DIRK0 citations48
ZEISS CARL NTS GMBH
6 patentsUS6855938B2Feb 15, 2005
Objective lens for an electron microscopy system and electron microscopy system
ZEISS CARL NTS GMBH97 citations95
US7425701B2Sep 16, 2008
Electron-beam device and detector system
ZEISS CARL NTS GMBH20 citations90
US7523009B2Apr 21, 2009
Control of instruments
ZEISS CARL NTS GMBH8 citations76
US7022987B2Apr 4, 2006
Particle-optical arrangements and particle-optical systems
ZEISS CARL NTS GMBH8 citations73
US7910887B2Mar 22, 2011
Electron-beam device and detector system
ZEISS CARL NTS GMBH4 citations71
US7507962B2Mar 24, 2009
Electron-beam device and detector system
ZEISS CARL NTS GMBH4 citations60