Inventor

BHAGWAT SANDEEP

US5 patents

⚠️ This page may combine multiple inventors who share the name “BHAGWAT SANDEEP”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

KLA TENCOR TECH CORP

2 patents

US7142992B1Nov 28, 2006

Flexible hybrid defect classification for semiconductor manufacturing

KLA TENCOR TECH CORP28 citations89

US7093207B1Aug 15, 2006

Data analysis flow engine

KLA TENCOR TECH CORP46 citations86

KLA CORP

2 patents

US11055840B2Jul 6, 2021

Semiconductor hot-spot and process-window discovery combining optical and electron-beam inspection

KLA CORP2 citations70

US12387310B2Aug 12, 2025

Wafer signature local maxima via clustering for metrology guided inspection

KLA CORP0 citations47

KLA TENCOR CORP

1 patent

US6718526B1Apr 6, 2004

Spatial signature analysis

KLA TENCOR CORP100 citations94