P

Inventor

LINIGER ERIC G

US22 patents
⚠️ This page may combine multiple inventors who share the name “LINIGER ERIC G”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

IBM

18 patents
US10418277B2Sep 17, 2019

Air gap spacer formation for nano-scale semiconductor devices

IBM159 citations99
US9892961B1Feb 13, 2018

Air gap spacer formation for nano-scale semiconductor devices

IBM49 citations98
US6271102B1Aug 7, 2001

Method and system for dicing wafers, and semiconductor structures incorporating the products thereof

IBM125 citations98
US6734090B2May 11, 2004

Method of making an edge seal for a semiconductor device

IBM605 citations97
US6915795B2Jul 12, 2005

Method and system for dicing wafers, and semiconductor structures incorporating the products thereof

IBM20 citations92
US7163883B2Jan 16, 2007

Edge seal for a semiconductor device

IBM27 citations91
US6222145B1Apr 24, 2001

Mechanical strength die sorting

IBM22 citations89
US10115629B2Oct 30, 2018

Air gap spacer formation for nano-scale semiconductor devices

IBM8 citations84
US7491578B1Feb 17, 2009

Method of forming crack trapping and arrest in thin film structures

IBM8 citations83
US7517790B2Apr 14, 2009

Method and structure to enhance temperature/humidity/bias performance of semiconductor devices by surface modification

IBM7 citations74
US9281211B2Mar 8, 2016

Nanoscale interconnect structure

IBM5 citations73
US6600213B2Jul 29, 2003

Semiconductor structure and package including a chip having chamfered edges

IBM7 citations73
US7573130B1Aug 11, 2009

Crack trapping and arrest in thin film structures

IBM5 citations61
US10309884B2Jun 4, 2019

Predicting semiconductor package warpage

IBM1 citations57
US9613900B2Apr 4, 2017

Nanoscale interconnect structure

IBM1 citations52
US7678673B2Mar 16, 2010

Strengthening of a structure by infiltration

IBM0 citations52
US7998880B2Aug 16, 2011

Low k dielectric CVD film formation process with in-situ imbedded nanolayers to improve mechanical properties

IBM0 citations51
US9772268B2Sep 26, 2017

Predicting semiconductor package warpage

IBM0 citations47

SONY CORP

1 patent

TESSERA LLC

1 patent

LINIGER ERIC G

1 patent

ADEIA SEMICONDUCTOR SOLUTIONS LLC

1 patent