Inventor
LEE CHUNG-TSE
TW10 patents
Patents
10 patentsUS10119991B2Nov 6, 2018
Vertical probe device and supporter used in the same
MPI CORP8 citations80
US9643271B2May 9, 2017
Method for making support structure for probing device
MPI CORP2 citations67
US9435856B2Sep 6, 2016
Position adjustable probing device and probe card assembly using the same
MPI CORP2 citations59
US9157929B2Oct 13, 2015
Apparatus for probing die electricity and method for forming the same
MPI CORP3 citations59
US9506978B2Nov 29, 2016
Apparatus for probing die electricity and method for forming the same
MPI CORP0 citations48
US9470750B2Oct 18, 2016
Alignment adjusting mechanism for probe card, position adjusting module using the same and modularized probing device
MPI CORP1 citations48
US9648757B2May 9, 2017
Method for manufacturing space transformer by using carrier substrate made for chip package and provided with elongated contacts
MPI CORP0 citations40
US9341648B2May 17, 2016
Probe card and manufacturing method thereof
MPI CORP0 citations40
US9465050B2Oct 11, 2016
Assembling method and maintaining method for vertical probe device
MPI CORP0 citations38
US9638716B2May 2, 2017
Positioner of probe card and probe head of probe card
MPI CORP0 citations37