Inventor

MCNEIL JEFFREY S

US32 patents

⚠️ This page may combine multiple inventors who share the name “MCNEIL JEFFREY S”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

MCNEIL JEFFREY S

MICRON TECHNOLOGY INC

Apparatus for discharging control gates after performing an access operation on a memory cell

Apparatus and methods for discharging control gates after performing an access operation on a memory cell

Volatile data storage in NAND memory

Validating read level voltage in memory devices

Workload-based scan optimization

Using duplicate data for improving error correction capability

Parallelized defect detection across multiple sub-blocks in a memory device

Concurrent programming of retired wordline cells with dummy data

Memory devices for multiple read operations

Two-pass corrective programming for memory cells that store multiple bits and power loss management for two-pass corrective programming

Workload-based scan optimization

Using duplicate data for improving error correction capability

Memory devices for multiple read operations

Apparatus for discharging control gates after performing a sensing operation on a memory cell

Overwriting at a memory system

Program command generation with dummy data generation at a memory device

Program command generation with dummy data generation at a memory device

Reducing program verifies for multi-level NAND cells

Reducing program verifies for multi-level NAND cells

Resequencing data programmed to multiple level memory cells at a memory sub-system

Generating semi-soft bit data during corrective read operations in memory devices

Selectively programming retired wordlines of a memory device

Sacrificial strings in a memory device to detect read disturb

Programming selective word lines during an erase operation in a memory device

Integrated command to calibrate read voltage level

On-die cross-temperature management for a memory device

Establishing bitline, wordline and boost voltages to manage a maximum program voltage level during all levels programming of a memory device

All level coarse/fine programming of memory cells

Concurrent slow-fast memory cell programming

Copyback clear command for performing a scan and read in a memory device

Two-tier defect scan management

RAMER PRODUCTS INC

Tool for smooth wall tubes