Inventor
KOSHIBA TAKESHI
JP15 patents
⚠️ This page may combine multiple inventors who share the name “KOSHIBA TAKESHI”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
TOSHIBA KK
6 patentsUS9381540B2Jul 5, 2016
Pattern forming method
TOSHIBA KK6 citations84
US8907346B2Dec 9, 2014
Imprint apparatus, imprint method, and manufacturing method of semiconductor device
TOSHIBA KK4 citations72
US7482604B2Jan 27, 2009
Electron beam lithography apparatus, lithography method, lithography program, and manufacturing method of a semiconductor device
TOSHIBA KK0 citations52
US7985958B2Jul 26, 2011
Electron beam drawing apparatus, deflection amplifier, deflection control device, electron beam drawing method, method of manufacturing semiconductor device, and electron beam drawing program
TOSHIBA KK1 citations51
US7889910B2Feb 15, 2011
Character pattern extracting method, charged particle beam drawing method, and character pattern extracting program
TOSHIBA KK0 citations41
US7459705B2Dec 2, 2008
Charged particle beam exposure method of character projection system, charged particle beam exposure device of character projection system, program for use in charged particle beam exposure device, and manufacturing method of semiconductor device
TOSHIBA KK0 citations41
FUJITSU LTD
4 patentsUS6330539B1Dec 11, 2001
Dialog interface system
FUJITSU LTD113 citations97
US6040840AMar 21, 2000
Virtual clay system and its method of simulation
FUJITSU LTD116 citations97
US5787426AJul 28, 1998
Data sorting, data sorting tree creating, derivative extracting and thesaurus creating apparatus and method, or data processing system
FUJITSU LTD25 citations89
US7257224B2Aug 14, 2007
Cryptographical pseudo-random number generation apparatus and program
FUJITSU LTD3 citations61
KOSHIBA TAKESHI
3 patentsUS9389513B2Jul 12, 2016
Method of forming pattern, system for calculating resist coating distribution and program for calculating the same
KOSHIBA TAKESHI3 citations70
US9046763B2Jun 2, 2015
Pattern forming method
KOSHIBA TAKESHI3 citations60
US8423926B2Apr 16, 2013
Acceptance determining method of blank for EUV mask and manufacturing method of EUV mask
KOSHIBA TAKESHI2 citations59