Inventor
GENNARI FRANK E
US23 patents
⚠️ This page may combine multiple inventors who share the name “GENNARI FRANK E”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
CADENCE DESIGN SYSTEMS INC
13 patentsUS7418693B1Aug 26, 2008
System and method for analysis and transformation of layouts using situations
CADENCE DESIGN SYSTEMS INC72 citations98
US7653892B1Jan 26, 2010
System and method for implementing image-based design rules
CADENCE DESIGN SYSTEMS INC48 citations97
US7818707B1Oct 19, 2010
Fast pattern matching
CADENCE DESIGN SYSTEMS INC36 citations96
US7707542B1Apr 27, 2010
Creating a situation repository
CADENCE DESIGN SYSTEMS INC24 citations96
US9519732B1Dec 13, 2016
Methods, systems, and articles of manufacture for implementing pattern-based design enabled manufacturing of electronic circuit designs
CADENCE DESIGN SYSTEMS INC18 citations92
US8365103B1Jan 29, 2013
System and method for implementing image-based design rules
CADENCE DESIGN SYSTEMS INC10 citations92
US7831942B1Nov 9, 2010
Design check database
CADENCE DESIGN SYSTEMS INC20 citations92
US7752577B1Jul 6, 2010
Constraint plus pattern
CADENCE DESIGN SYSTEMS INC11 citations92
US9053259B1Jun 9, 2015
Methods, systems, and articles of manufacture for implementing pattern-based design enabled manufacturing of electronic circuit designs
CADENCE DESIGN SYSTEMS INC16 citations83
US8381152B2Feb 19, 2013
Method and system for model-based design and layout of an integrated circuit
CADENCE DESIGN SYSTEMS INC10 citations83
US7661087B1Feb 9, 2010
Yield analysis with situations
CADENCE DESIGN SYSTEMS INC4 citations73
US10796067B1Oct 6, 2020
EDA CAA with learning phase
CADENCE DESIGN SYSTEMS INC2 citations67
US11928582B1Mar 12, 2024
System, media, and method for deep learning
CADENCE DESIGN SYSTEMS INC0 citations49
GENNARI FRANK E
5 patentsUS8832621B1Sep 9, 2014
Topology design using squish patterns
GENNARI FRANK E18 citations92
US8769474B1Jul 1, 2014
Fast pattern matching
GENNARI FRANK E8 citations92
US8631373B1Jan 14, 2014
Yield analysis with situations
GENNARI FRANK E8 citations92
US8327299B1Dec 4, 2012
System and method for implementing image-based design rules
GENNARI FRANK E13 citations92
US8091047B1Jan 3, 2012
System and method for implementing image-based design rules
GENNARI FRANK E3 citations73
UNIV CALIFORNIA
2 patentsUS7155698B1Dec 26, 2006
Method of locating areas in an image such as a photo mask layout that are sensitive to residual processing effects
UNIV CALIFORNIA58 citations96
US7030997B2Apr 18, 2006
Characterizing aberrations in an imaging lens and applications to visual testing and integrated circuit mask analysis
UNIV CALIFORNIA85 citations92