Inventor
NARIKAWA KENICHI
JP6 patents
⚠️ This page may combine multiple inventors who share the name “NARIKAWA KENICHI”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
TOKYO ELECTRON LTD
4 patentsUS10859601B2Dec 8, 2020
Device inspection circuit, device inspection device, and probe card
TOKYO ELECTRON LTD2 citations68
US11454664B2Sep 27, 2022
Testing system
TOKYO ELECTRON LTD0 citations54
US10114070B2Oct 30, 2018
Substrate inspection apparatus
TOKYO ELECTRON LTD0 citations39
US11293978B2Apr 5, 2022
Voltage application device for testing plurality of devices and method of forming output voltage waveform
TOKYO ELECTRON LTD0 citations38