Inventor
YOUSSEF TOM
US17 patents
⚠️ This page may combine multiple inventors who share the name “YOUSSEF TOM”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
ST MICROELECTRONICS INC
16 patentsUS7142024B2Nov 28, 2006
Power on reset circuit
ST MICROELECTRONICS INC25 citations92
US6118188ASep 12, 2000
Apparatus and method for switching between two power supplies of an integrated circuit
ST MICROELECTRONICS INC28 citations92
US6081466AJun 27, 2000
Stress test mode entry at power up for low/zero power memories
ST MICROELECTRONICS INC21 citations92
US6041000AMar 21, 2000
Initialization for fuse control
ST MICROELECTRONICS INC30 citations92
US7844837B2Nov 30, 2010
Electronic device and timer therefor with tamper event time stamp features and related methods
ST MICROELECTRONICS INC14 citations83
US6787938B1Sep 7, 2004
Method and circuit for switchover between a primary and a secondary power source
ST MICROELECTRONICS INC7 citations74
US7287169B2Oct 23, 2007
Electronic device and timer therefor with tamper event stamp features and related methods
ST MICROELECTRONICS INC8 citations73
US6909313B2Jun 21, 2005
Circuit and method for detecting the state of a switch with reduced power
ST MICROELECTRONICS INC6 citations73
US6075742AJun 13, 2000
Integrated circuit for switching from power supply to battery, integrated latch lock, and associated method for same
ST MICROELECTRONICS INC9 citations73
US9568927B2Feb 14, 2017
Current modulation circuit
ST MICROELECTRONICS INC2 citations70
US7132767B2Nov 7, 2006
Method and circuit for switchover between a primary and a secondary power source
ST MICROELECTRONICS INC3 citations63
US6034917AMar 7, 2000
Control circuit for terminating a memory access cycle in a memory block of an electronic storage device
ST MICROELECTRONICS INC5 citations63
US6717292B2Apr 6, 2004
Method and structure for measurement of a multiple-power-source device during a test mode
ST MICROELECTRONICS INC3 citations62
US6084390AJul 4, 2000
Method and apparatus for increasing comparator gain without affecting standby current
ST MICROELECTRONICS INC5 citations62
US6365991B1Apr 2, 2002
Method and structure for measurement of a multiple-power-source device during a test mode
ST MICROELECTRONICS INC1 citations52
US6903584B2Jun 7, 2005
Circuit and method for detecting the state of a switch
ST MICROELECTRONICS INC1 citations51