Inventor
MA MANNY K
US25 patents
Patents
25 patentsUS6028799AFeb 22, 2000
Memory circuit voltage regulator
MICRON TECHNOLOGY INC17 citations96
US6365937B1Apr 2, 2002
Electrostatic discharge protection device having a graded junction
MICRON TECHNOLOGY INC18 citations92
US6355508B1Mar 12, 2002
Method for forming electrostatic discharge protection device having a graded junction
MICRON TECHNOLOGY INC25 citations92
US6259621B1Jul 10, 2001
Method and apparatus for minimization of data line coupling in a semiconductor memory device
MICRON TECHNOLOGY INC16 citations92
US5877993AMar 2, 1999
Memory circuit voltage regulator
MICRON TECHNOLOGY INC16 citations86
US6778452B2Aug 17, 2004
Circuit and method for voltage regulation in a semiconductor device
MICRON TECHNOLOGY INC6 citations82
US6052322AApr 18, 2000
Memory circuit voltage regulator
MICRON TECHNOLOGY INC6 citations82
US6011731AJan 4, 2000
Cell plate regulator
MICRON TECHNOLOGY INC7 citations82
US6320781B1Nov 20, 2001
Apparatus for minimization of data line coupling in a semiconductor memory device
MICRON TECHNOLOGY INC8 citations74
US6181617B1Jan 30, 2001
Method and apparatus for testing a semiconductor device
MICRON TECHNOLOGY INC2 citations74
US5982687ANov 9, 1999
Method of detecting leakage within a memory cell capacitor
MICRON TECHNOLOGY INC3 citations74
US5974577AOct 26, 1999
Integrated circuit with voltage over-stress indicating circuit
MICRON TECHNOLOGY INC12 citations74
US6593218B2Jul 15, 2003
Electrostatic discharge protection device having a graded junction and method for forming the same
MICRON TECHNOLOGY INC8 citations73
US6576960B2Jun 10, 2003
Electrostatic discharge protection device having a graded junction and method for forming the same
MICRON TECHNOLOGY INC5 citations73
US6882587B2Apr 19, 2005
Method of preparing to test a capacitor
MICRON TECHNOLOGY INC0 citations63
US6600687B2Jul 29, 2003
Method of compensating for a defect within a semiconductor device
MICRON TECHNOLOGY INC0 citations63
US6469944B2Oct 22, 2002
Method of compensating for a defect within a semiconductor device
MICRON TECHNOLOGY INC0 citations63
US6445629B2Sep 3, 2002
Method of stressing a memory device
MICRON TECHNOLOGY INC0 citations63
US6418071B2Jul 9, 2002
Method of testing a memory cell
MICRON TECHNOLOGY INC0 citations63
US6353564B1Mar 5, 2002
Method of testing a memory array
MICRON TECHNOLOGY INC0 citations63
US6226210B1May 1, 2001
Method of detecting a short from a digit line pair to ground
MICRON TECHNOLOGY INC0 citations63
US6198676B1Mar 6, 2001
Test device
MICRON TECHNOLOGY INC0 citations63
US6188622B1Feb 13, 2001
Method of identifying a defect within a memory circuit
MICRON TECHNOLOGY INC1 citations63
US6026040AFeb 15, 2000
Method of altering the margin affecting a memory cell
MICRON TECHNOLOGY INC1 citations63
US6787400B2Sep 7, 2004
Electrostatic discharge protection device having a graded junction and method for forming the same
MICRON TECHNOLOGY INC3 citations62