Inventor
TAKAGI YUUJI
JP13 patents
⚠️ This page may combine multiple inventors who share the name “TAKAGI YUUJI”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
MATSUSHITA ELECTRIC INDUSTRIAL CO LTD
7 patentsUS4879704ANov 7, 1989
Optical disk, optical disk recording and reproducing apparatus and copy preventive method for optical disks
MATSUSHITA ELECTRIC INDUSTRIAL CO LTD96 citations96
US4805046AFeb 14, 1989
Information recording and reproducing apparatus using sectors divided into a plurality of frames and having means for proper storage of the frame data
MATSUSHITA ELECTRIC INDUSTRIAL CO LTD89 citations96
US4986668AJan 22, 1991
Information recording and reproducing apparatus with management of defective sector
MATSUSHITA ELECTRIC INDUSTRIAL CO LTD23 citations92
US4695993ASep 22, 1987
Optical information recording and reproducing apparatus and optical disc
MATSUSHITA ELECTRIC INDUSTRIAL CO LTD46 citations90
US4885735ADec 5, 1989
Information recording and reproducing apparatus with management of defective sector
MATSUSHITA ELECTRIC INDUSTRIAL CO LTD23 citations82
US4799208AJan 17, 1989
Optical recording and reproducing apparatus having erasing function with controllable erasing beam
MATSUSHITA ELECTRIC INDUSTRIAL CO LTD4 citations63
US4789911ADec 6, 1988
Information recording and reproducing apparatus
MATSUSHITA ELECTRIC INDUSTRIAL CO LTD4 citations63
HITACHI LTD
3 patentsUS5134575AJul 28, 1992
Method of producing numerical control data for inspecting assembled printed circuit board
HITACHI LTD71 citations95
US6792366B2Sep 14, 2004
Method and apparatus for inspecting defects in a semiconductor wafer
HITACHI LTD21 citations92
US6792367B2Sep 14, 2004
Method and apparatus for inspecting defects in a semiconductor wafer
HITACHI LTD18 citations92
HITACHI HIGH TECH CORP
2 patentsUS6913861B2Jul 5, 2005
Method of observing exposure condition for exposing semiconductor device and its apparatus and method of manufacturing semiconductor device
HITACHI HIGH TECH CORP24 citations92
US7598491B2Oct 6, 2009
Observing method and its apparatus using electron microscope
HITACHI HIGH TECH CORP9 citations83