Inventor

THYS FRANK

BE4 patents

⚠️ This page may combine multiple inventors who share the name “THYS FRANK”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

NIKON METROLOGY NV

2 patents

US9696146B2Jul 4, 2017

Optical scanning probe

NIKON METROLOGY NV5 citations62

US10267629B2Apr 23, 2019

Measurement probe unit for metrology applications

NIKON METROLOGY NV2 citations60

METRIS N V

1 patent

US7009717B2Mar 7, 2006

Optical probe for scanning the features of an object and methods therefor

METRIS N V34 citations87

METRIS IPR N V

1 patent

US7428061B2Sep 23, 2008

Optical probe for scanning the features of an object and methods thereof

METRIS IPR N V25 citations82