P

Inventor

SHANNON STEVEN C

US38 patents
⚠️ This page may combine multiple inventors who share the name “SHANNON STEVEN C”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

APPLIED MATERIALS INC

28 patents
US7967944B2Jun 28, 2011

Method of plasma load impedance tuning by modulation of an unmatched low power RF generator

APPLIED MATERIALS INC57 citations98
US8018164B2Sep 13, 2011

Plasma reactor with high speed plasma load impedance tuning by modulation of different unmatched frequency sources

APPLIED MATERIALS INC47 citations94
US7968469B2Jun 28, 2011

Method of processing a workpiece in a plasma reactor with variable height ground return path to control plasma ion density uniformity

APPLIED MATERIALS INC46 citations94
US8357264B2Jan 22, 2013

Plasma reactor with plasma load impedance tuning for engineered transients by synchronized modulation of a source power or bias power RF generator

APPLIED MATERIALS INC33 citations93
US7780866B2Aug 24, 2010

Method of plasma confinement for enhancing magnetic control of plasma radial distribution

APPLIED MATERIALS INC40 citations92
US7359177B2Apr 15, 2008

Dual bias frequency plasma reactor with feedback control of E.S.C. voltage using wafer voltage measurement at the bias supply output

APPLIED MATERIALS INC42 citations92
US7326872B2Feb 5, 2008

Multi-frequency dynamic dummy load and method for testing plasma reactor multi-frequency impedance match networks

APPLIED MATERIALS INC19 citations92
US7620511B2Nov 17, 2009

Method for determining plasma characteristics

APPLIED MATERIALS INC14 citations91
US6652712B2Nov 25, 2003

Inductive antenna for a plasma reactor producing reduced fluorine dissociation

APPLIED MATERIALS INC29 citations91
US7431857B2Oct 7, 2008

Plasma generation and control using a dual frequency RF source

APPLIED MATERIALS INC26 citations90
US8002945B2Aug 23, 2011

Method of plasma load impedance tuning for engineered transients by synchronized modulation of an unmatched low power RF generator

APPLIED MATERIALS INC17 citations84
US7988815B2Aug 2, 2011

Plasma reactor with reduced electrical skew using electrical bypass elements

APPLIED MATERIALS INC11 citations84
US7972467B2Jul 5, 2011

Apparatus and method to confine plasma and reduce flow resistance in a plasma reactor

APPLIED MATERIALS INC10 citations84
US7879185B2Feb 1, 2011

Dual frequency RF match

APPLIED MATERIALS INC7 citations84
US7879731B2Feb 1, 2011

Improving plasma process uniformity across a wafer by apportioning power among plural VHF sources

APPLIED MATERIALS INC13 citations84
US7813103B2Oct 12, 2010

Time-based wafer de-chucking from an electrostatic chuck having separate RF BIAS and DC chucking electrodes

APPLIED MATERIALS INC14 citations84
US7812278B2Oct 12, 2010

Method for testing plasma reactor multi-frequency impedance match networks

APPLIED MATERIALS INC13 citations84
US7777599B2Aug 17, 2010

Methods and apparatus for controlling characteristics of a plasma

APPLIED MATERIALS INC12 citations84
US7754997B2Jul 13, 2010

Apparatus and method to confine plasma and reduce flow resistance in a plasma

APPLIED MATERIALS INC8 citations84
US7585384B2Sep 8, 2009

Apparatus and method to confine plasma and reduce flow resistance in a plasma reactor

APPLIED MATERIALS INC10 citations84
US7510665B2Mar 31, 2009

Plasma generation and control using dual frequency RF signals

APPLIED MATERIALS INC17 citations84
US7848898B2Dec 7, 2010

Method for monitoring process drift using plasma characteristics

APPLIED MATERIALS INC11 citations83
US7838430B2Nov 23, 2010

Plasma control using dual cathode frequency mixing

APPLIED MATERIALS INC8 citations83
US7994872B2Aug 9, 2011

Apparatus for multiple frequency power application

APPLIED MATERIALS INC6 citations74
US7286948B1Oct 23, 2007

Method for determining plasma characteristics

APPLIED MATERIALS INC9 citations72
US7884025B2Feb 8, 2011

Plasma process uniformity across a wafer by apportioning ground return path impedances among plural VHF sources

APPLIED MATERIALS INC4 citations63
US7375947B2May 20, 2008

Method of feedback control of ESC voltage using wafer voltage measurement at the bias supply output

APPLIED MATERIALS INC3 citations63
US7440859B2Oct 21, 2008

Method for determining plasma characteristics

APPLIED MATERIALS INC2 citations61

SHANNON STEVEN C

4 patents

COLLINS KENNETH S

2 patents

(unassigned)

1 patent

MEHTA VINEET

1 patent

APPLIED MARTERIALS INC

1 patent

UNIV NORTH CAROLINA STATE

1 patent