Inventor

BANG JEONG HO

KR42 patents

⚠️ This page may combine multiple inventors who share the name “BANG JEONG HO”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

BANG JEONG HO

SAMSUNG ELECTRONICS CO LTD

Chip separation device and method

Socket including pressure conductive rubber and mesh for testing of ball grid array package

Power saving display device and method for controlling power thereof

Surge protection circuit for a switching mode power supply

Test apparatus having multiple test sites at one handler and its test method

Burn-in test apparatus for BGA packages using forced heat exhaust

Method for electrical testing of semiconductor package that detects socket defects in real time

Semiconductor package testing equipment including loader having package guider and method of loading a semiconductor package onto a test socket as aligned therewith

Connector for testing a semiconductor package

Apparatus and method for performing parallel test on integrated circuit devices

Handoff system and method between different kinds of devices, SIP server and operational method of SIP server

Circuit for controlling a contrast level and compensating a brightness level of a video display apparatus and method therefor

Method for manufacturing lead-on-chip (LOC) semiconductor packages using liquid adhesive applied under the leads

Laser link structure capable of preventing an upper crack and broadening an energy window of a laser beam, and fuse box using the same

Fuse box including make-link and redundant address decoder having the same, and method for repairing defective memory cell

Test method for high speed memory devices in which limit conditions for the clock are defined

Flash memory test system and method capable of test time reduction

Multichip package test

Method of electrically testing semiconductor devices

Plasma display panel apparatus and method of protecting an over current thereof

Broadband switching drive compensating circuit for a video display device

Front/back porch voltage-regulator of vertical focus control signal

Vertical focusing circuit

Semiconductor device testing system

Test apparatus having multiple head boards at one handler and its test method

Test apparatus having multiple test sites at one handler and its test method

Test kit for semiconductor package and method for testing semiconductor package using the same

Test system of semiconductor device having a handler remote control and method of operating the same

Wafer treatment method for protecting fuse box of semiconductor chip

Multichip package test

Method for detecting operational errors in a tester for semiconductor devices

Fuse regions of a semiconductor memory device and methods of fabricating the same

Apparatus for generating dynamic focus signal

Test system of semiconductor device having a handler remote control and method of operating the same

Method for testing a remnant batch of semiconductor devices

Display apparatus

Vertical oscillation circuit for display device

HYNIX SEMICONDUCTOR INC

Pipe latch circuit for outputting data with high speed

Integrated circuit with improved output control signal and method for generating improved output control signal

INTEGRATED SILICON SOLUTION INC

Memory core characteristic screening method and system thereof

Memory interface circuitry and built-in self-testing method

HYUNDAI ELECTRONICS IND

Duty cycle compensation circuit of delay locked loop for Rambus DRAM