Inventor

DOONG YIH-YUH

TW17 patents

⚠️ This page may combine multiple inventors who share the name “DOONG YIH-YUH”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

DOONG YIH-YUH

TAIWAN SEMICONDUCTOR MFG

Electrical parameter extraction for integrated circuit design

Structure for FIB based microanalysis and method for manufacturing it

Method and device for addressable failure site test structure

Method for shape and timing equivalent dimension extraction

Accurate capacitance measurement for ultra large scale integrated circuits

Accurate capacitance measurement for ultra large scale integrated circuits

Versatile semiconductor test structure array

Test pad design for reducing the effect of contact resistances

UNITED MICROELECTRONICS CORP

Method of forming precisely cross-sectioned electron-transparent samples

Method of removing thin film layers of a semiconductor component

Method for preventing charging effect and thermal damage in charged-particle microscopy

PDF SOLUTIONS INC

On-chip capacitance measurement for memory characterization vehicle

Direct probing characterization vehicle for transistor, capacitor and resistor testing

Direct access memory characterization vehicle

WORLDWIDE SEMICONDUCTOR MFG

Method of forming shallow trench isolation structures

DOONG YIH-YUH

Accurate capacitance measurement for ultra large scale integrated circuits

TAIWAN SEMICONDUCTOR MFG CORP

Semiconductor device comprising a test structure