Inventor
TAKAGI RYOICHI
JP11 patents
⚠️ This page may combine multiple inventors who share the name “TAKAGI RYOICHI”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
MITSUBISHI ELECTRIC CORP
10 patentsUS4961052AOct 2, 1990
Probing plate for wafer testing
MITSUBISHI ELECTRIC CORP141 citations97
US5436559AJul 25, 1995
Method for testing semiconductor device
MITSUBISHI ELECTRIC CORP45 citations96
US5266894ANov 30, 1993
Apparatus and method for testing semiconductor device
MITSUBISHI ELECTRIC CORP55 citations96
US6356096B2Mar 12, 2002
Test board for testing a semiconductor device utilizing first and second delay elements in a signal-transmission-path
MITSUBISHI ELECTRIC CORP35 citations92
US5969533AOct 19, 1999
Probe card and LSI test method using probe card
MITSUBISHI ELECTRIC CORP34 citations92
US6150831ANov 21, 2000
Test method and device for semiconductor circuit
MITSUBISHI ELECTRIC CORP19 citations91
US6704897B1Mar 9, 2004
Semiconductor device and the test system for the same
MITSUBISHI ELECTRIC CORP14 citations83
US6282680B1Aug 28, 2001
Semiconductor device
MITSUBISHI ELECTRIC CORP18 citations83
US6486690B1Nov 26, 2002
Device under test board and testing method
MITSUBISHI ELECTRIC CORP9 citations71
US5844263ADec 1, 1998
Semiconductor integrated device having independent circuit blocks and a power breaking means for selectively supplying power to the circuit blocks
MITSUBISHI ELECTRIC CORP9 citations71