Inventor
YANG CHIH YUH
US70 patents
⚠️ This page may combine multiple inventors who share the name “YANG CHIH YUH”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
ADVANCED MICRO DEVICES INC
49 patentsUS6835618B1Dec 28, 2004
Epitaxially grown fin for FinFET
ADVANCED MICRO DEVICES INC229 citations99
US6773998B1Aug 10, 2004
Modified film stack and patterning strategy for stress compensation and prevention of pattern distortion in amorphous carbon gate patterning
ADVANCED MICRO DEVICES INC208 citations99
US6645797B1Nov 11, 2003
Method for forming fins in a FinFET device using sacrificial carbon layer
ADVANCED MICRO DEVICES INC273 citations99
US6787854B1Sep 7, 2004
Method for forming a fin in a finFET device
ADVANCED MICRO DEVICES INC113 citations98
US6451647B1Sep 17, 2002
Integrated plasma etch of gate and gate dielectric and low power plasma post gate etch removal of high-K residual
ADVANCED MICRO DEVICES INC92 citations98
US6211044B1Apr 3, 2001
Process for fabricating a semiconductor device component using a selective silicidation reaction
ADVANCED MICRO DEVICES INC242 citations98
US6184128B1Feb 6, 2001
Method using a thin resist mask for dual damascene stop layer etch
ADVANCED MICRO DEVICES INC139 citations98
US6020269AFeb 1, 2000
Ultra-thin resist and nitride/oxide hard mask for metal etch
ADVANCED MICRO DEVICES INC92 citations98
US6750127B1Jun 15, 2004
Method for fabricating a semiconductor device using amorphous carbon having improved etch resistance
ADVANCED MICRO DEVICES INC61 citations96
US6653735B1Nov 25, 2003
CVD silicon carbide layer as a BARC and hard mask for gate patterning
ADVANCED MICRO DEVICES INC57 citations96
US6563183B1May 13, 2003
Gate array with multiple dielectric properties and method for forming same
ADVANCED MICRO DEVICES INC113 citations96
US6440640B1Aug 27, 2002
Thin resist with transition metal hard mask for via etch application
ADVANCED MICRO DEVICES INC53 citations96
US6309926B1Oct 30, 2001
Thin resist with nitride hard mask for gate etch application
ADVANCED MICRO DEVICES INC58 citations96
US6165695ADec 26, 2000
Thin resist with amorphous silicon hard mask for via etch application
ADVANCED MICRO DEVICES INC57 citations96
US7183152B1Feb 27, 2007
Epitaxially grown fin for FinFET
ADVANCED MICRO DEVICES INC34 citations93
US7029958B2Apr 18, 2006
Self aligned damascene gate
ADVANCED MICRO DEVICES INC31 citations93
US6960804B1Nov 1, 2005
Semiconductor device having a gate structure surrounding a fin
ADVANCED MICRO DEVICES INC22 citations93
US6864556B1Mar 8, 2005
CVD organic polymer film for advanced gate patterning
ADVANCED MICRO DEVICES INC30 citations93
US6797552B1Sep 28, 2004
Method for defect reduction and enhanced control over critical dimensions and profiles in semiconductor devices
ADVANCED MICRO DEVICES INC22 citations93
US6790782B1Sep 14, 2004
Process for fabrication of a transistor gate including high-K gate dielectric with in-situ resist trim, gate etch, and high-K dielectric removal
ADVANCED MICRO DEVICES INC42 citations93
US6787476B1Sep 7, 2004
Etch stop layer for etching FinFET gate over a large topography
ADVANCED MICRO DEVICES INC21 citations93
US6653231B2Nov 25, 2003
Process for reducing the critical dimensions of integrated circuit device features
ADVANCED MICRO DEVICES INC31 citations93
US6630288B2Oct 7, 2003
Process for forming sub-lithographic photoresist features by modification of the photoresist surface
ADVANCED MICRO DEVICES INC19 citations93
US6589709B1Jul 8, 2003
Process for preventing deformation of patterned photoresist features
ADVANCED MICRO DEVICES INC31 citations93
US6579809B1Jun 17, 2003
In-situ gate etch process for fabrication of a narrow gate transistor structure with a high-k gate dielectric
ADVANCED MICRO DEVICES INC34 citations93
US6306560B1Oct 23, 2001
Ultra-thin resist and SiON/oxide hard mask for metal etch
ADVANCED MICRO DEVICES INC34 citations93
US6200907B1Mar 13, 2001
Ultra-thin resist and barrier metal/oxide hard mask for metal etch
ADVANCED MICRO DEVICES INC46 citations93
US6200884B1Mar 13, 2001
Method for shaping photoresist mask to improve high aspect ratio ion implantation
ADVANCED MICRO DEVICES INC20 citations93
US6171763B1Jan 9, 2001
Ultra-thin resist and oxide/nitride hard mask for metal etch
ADVANCED MICRO DEVICES INC38 citations93
US6162587ADec 19, 2000
Thin resist with transition metal hard mask for via etch application
ADVANCED MICRO DEVICES INC27 citations93
US6156658ADec 5, 2000
Ultra-thin resist and silicon/oxide hard mask for metal etch
ADVANCED MICRO DEVICES INC20 citations93
US6140023AOct 31, 2000
Method for transferring patterns created by lithography
ADVANCED MICRO DEVICES INC33 citations93
US6127070AOct 3, 2000
Thin resist with nitride hard mask for via etch application
ADVANCED MICRO DEVICES INC53 citations93
US6764966B1Jul 20, 2004
Spacers with a graded dielectric constant for semiconductor devices having a high-K dielectric
ADVANCED MICRO DEVICES INC28 citations92
US6764949B2Jul 20, 2004
Method for reducing pattern deformation and photoresist poisoning in semiconductor device fabrication
ADVANCED MICRO DEVICES INC53 citations92
US6121155ASep 19, 2000
Integrated circuit fabrication critical dimension control using self-limiting resist etch
ADVANCED MICRO DEVICES INC24 citations92
US5990524ANov 23, 1999
Silicon oxime spacer for preventing over-etching during local interconnect formation
ADVANCED MICRO DEVICES INC40 citations92
US6107172AAug 22, 2000
Controlled linewidth reduction during gate pattern formation using an SiON BARC
ADVANCED MICRO DEVICES INC54 citations91
US5965461AOct 12, 1999
Controlled linewidth reduction during gate pattern formation using a spin-on barc
ADVANCED MICRO DEVICES INC45 citations91
US6323093B1Nov 27, 2001
Process for fabricating a semiconductor device component by oxidizing a silicon hard mask
ADVANCED MICRO DEVICES INC18 citations83
US6287918B1Sep 11, 2001
Process for fabricating a metal semiconductor device component by lateral oxidization
ADVANCED MICRO DEVICES INC17 citations83
US6828259B2Dec 7, 2004
Enhanced transistor gate using E-beam radiation
ADVANCED MICRO DEVICES INC16 citations81
US6606738B1Aug 12, 2003
Analytical model for predicting the operating process window for lithographic patterning techniques based on photoresist trim technology
ADVANCED MICRO DEVICES INC13 citations80
US7183223B1Feb 27, 2007
Methods for forming small contacts
ADVANCED MICRO DEVICES INC5 citations74
US6913958B1Jul 5, 2005
Method for patterning a feature using a trimmed hardmask
ADVANCED MICRO DEVICES INC9 citations74
US6905971B1Jun 14, 2005
Treatment of dielectric material to enhance etch rate
ADVANCED MICRO DEVICES INC9 citations74
US6849530B2Feb 1, 2005
Method for semiconductor gate line dimension reduction
ADVANCED MICRO DEVICES INC10 citations74
US6764947B1Jul 20, 2004
Method for reducing gate line deformation and reducing gate line widths in semiconductor devices
ADVANCED MICRO DEVICES INC9 citations74
US6740566B2May 25, 2004
Ultra-thin resist shallow trench process using high selectivity nitride etch
ADVANCED MICRO DEVICES INC12 citations74
SPANSION LLC
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