Inventor
TAN CHUNG FOONG
US38 patents
⚠️ This page may combine multiple inventors who share the name “TAN CHUNG FOONG”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
CHARTERED SEMICONDUCTOR MFG
8 patentsUS7169675B2Jan 30, 2007
Material architecture for the fabrication of low temperature transistor
CHARTERED SEMICONDUCTOR MFG164 citations97
US7109099B2Sep 19, 2006
End of range (EOR) secondary defect engineering using substitutional carbon doping
CHARTERED SEMICONDUCTOR MFG102 citations96
US7071069B2Jul 4, 2006
Shallow amorphizing implant for gettering of deep secondary end of range defects
CHARTERED SEMICONDUCTOR MFG18 citations82
US7846800B2Dec 7, 2010
Avoiding plasma charging in integrated circuits
CHARTERED SEMICONDUCTOR MFG6 citations63
US7994010B2Aug 9, 2011
Process for fabricating a semiconductor device having embedded epitaxial regions
CHARTERED SEMICONDUCTOR MFG2 citations61
US7400018B2Jul 15, 2008
End of range (EOR) secondary defect engineering using chemical vapor deposition (CVD) substitutional carbon doping
CHARTERED SEMICONDUCTOR MFG3 citations61
US7833888B2Nov 16, 2010
Integrated circuit system employing grain size enlargement
CHARTERED SEMICONDUCTOR MFG0 citations52
US7816274B2Oct 19, 2010
Methods for normalizing strain in a semiconductor device
CHARTERED SEMICONDUCTOR MFG0 citations40
TOH ENG HUAT
8 patentsUS8502279B2Aug 6, 2013
Nano-electro-mechanical system (NEMS) structures with actuatable semiconductor fin on bulk substrates
TOH ENG HUAT24 citations92
US8492235B2Jul 23, 2013
FinFET with stressors
TOH ENG HUAT29 citations92
US9034711B2May 19, 2015
LDMOS with two gate stacks having different work functions for improved breakdown voltage
TOH ENG HUAT5 citations84
US8889494B2Nov 18, 2014
Finfet
TOH ENG HUAT14 citations84
US8748271B2Jun 10, 2014
LDMOS with improved breakdown voltage
TOH ENG HUAT13 citations84
US8750037B2Jun 10, 2014
Non-volatile memory utilizing impact ionization and tunnelling and method of manufacturing thereof
TOH ENG HUAT4 citations73
US8674457B2Mar 18, 2014
Methods to reduce gate contact resistance for AC reff reduction
TOH ENG HUAT6 citations73
US8470700B2Jun 25, 2013
Semiconductor device with reduced contact resistance and method of manufacturing thereof
TOH ENG HUAT0 citations52
GLOBALFOUNDRIES SG PTE LTD
8 patentsUS9219147B2Dec 22, 2015
LDMOS with improved breakdown voltage
GLOBALFOUNDRIES SG PTE LTD6 citations84
US8975708B2Mar 10, 2015
Semiconductor device with reduced contact resistance and method of manufacturing thereof
GLOBALFOUNDRIES SG PTE LTD6 citations84
US8349692B2Jan 8, 2013
Channel surface technique for fabrication of FinFET devices
GLOBALFOUNDRIES SG PTE LTD9 citations84
US9406801B2Aug 2, 2016
FinFET
GLOBALFOUNDRIES SG PTE LTD5 citations73
US7998835B2Aug 16, 2011
Strain-direct-on-insulator (SDOI) substrate and method of forming
GLOBALFOUNDRIES SG PTE LTD4 citations63
US10032902B2Jul 24, 2018
LDMOS with improved breakdown voltage and with non-uniformed gate dielectric and gate electrode
GLOBALFOUNDRIES SG PTE LTD1 citations52
US9171953B2Oct 27, 2015
FinFET with stressors
GLOBALFOUNDRIES SG PTE LTD1 citations52
US8824208B2Sep 2, 2014
Non-volatile memory using pyramidal nanocrystals as electron storage elements
GLOBALFOUNDRIES SG PTE LTD0 citations52
TAN CHUNG FOONG
5 patentsUS8896072B2Nov 25, 2014
Channel surface technique for fabrication of FinFET devices
TAN CHUNG FOONG5 citations83
US8110470B2Feb 7, 2012
Asymmetrical transistor device and method of fabrication
TAN CHUNG FOONG4 citations62
US8778772B2Jul 15, 2014
Method of forming transistor with increased gate width
TAN CHUNG FOONG3 citations57
US8629503B2Jan 14, 2014
Asymmetrical transistor device and method of fabrication
TAN CHUNG FOONG1 citations51
US8563386B2Oct 22, 2013
Integrated circuit system with bandgap material and method of manufacture thereof
TAN CHUNG FOONG0 citations47
GLOBALFOUNDRIES INC
4 patentsUS9812573B1Nov 7, 2017
Semiconductor structure including a transistor having stress creating regions and method for the formation thereof
GLOBALFOUNDRIES INC7 citations82
US10872979B2Dec 22, 2020
Spacer structures for a transistor device
GLOBALFOUNDRIES INC1 citations62
US10629739B2Apr 21, 2020
Methods of forming spacers adjacent gate structures of a transistor device
GLOBALFOUNDRIES INC1 citations62
US10797049B2Oct 6, 2020
FinFET structure with dielectric bar containing gate to reduce effective capacitance, and method of forming same
GLOBALFOUNDRIES INC0 citations51