P

Inventor

TSENG HSING-HUANG

US20 patents
⚠️ This page may combine multiple inventors who share the name “TSENG HSING-HUANG”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

MOTOROLA INC

18 patents
US6063698AMay 16, 2000

Method for manufacturing a high dielectric constant gate oxide for use in semiconductor integrated circuits

MOTOROLA INC231 citations99
US5972804AOct 26, 1999

Process for forming a semiconductor device

MOTOROLA INC181 citations98
US5960289ASep 28, 1999

Method for making a dual-thickness gate oxide layer using a nitride/oxide composite region

MOTOROLA INC251 citations98
US5712208AJan 27, 1998

Methods of formation of semiconductor composite gate dielectric having multiple incorporated atomic dopants

MOTOROLA INC95 citations98
US5552332ASep 3, 1996

Process for fabricating a MOSFET device having reduced reverse short channel effects

MOTOROLA INC160 citations98
US5464792ANov 7, 1995

Process to incorporate nitrogen at an interface of a dielectric layer in a semiconductor device

MOTOROLA INC122 citations98
US6297173B1Oct 2, 2001

Process for forming a semiconductor device

MOTOROLA INC52 citations96
US5726087AMar 10, 1998

Method of formation of semiconductor gate dielectric

MOTOROLA INC89 citations96
US5571734ANov 5, 1996

Method for forming a fluorinated nitrogen containing dielectric

MOTOROLA INC71 citations96
US5436488AJul 25, 1995

Trench isolator structure in an integrated circuit

MOTOROLA INC60 citations96
US5387540AFeb 7, 1995

Method of forming trench isolation structure in an integrated circuit

MOTOROLA INC105 citations96
US5371026ADec 6, 1994

Method for fabricating paired MOS transistors having a current-gain differential

MOTOROLA INC85 citations96
US5580815ADec 3, 1996

Process for forming field isolation and a structure over a semiconductor substrate

MOTOROLA INC74 citations93
US5830802ANov 3, 1998

Process for reducing halogen concentration in a material layer during semiconductor device fabrication

MOTOROLA INC32 citations92
US5707889AJan 13, 1998

Process for forming field isolation

MOTOROLA INC21 citations91
US5731238AMar 24, 1998

Integrated circuit having a jet vapor deposition silicon nitride film and method of making the same

MOTOROLA INC52 citations89
US6146948ANov 14, 2000

Method for manufacturing a thin oxide for use in semiconductor integrated circuits

MOTOROLA INC42 citations86
US5712177AJan 27, 1998

Method for forming a reverse dielectric stack

MOTOROLA INC18 citations83

FREESCALE SEMICONDUCTOR INC

2 patents