Inventor
OHTA MITSUYASU
JP19 patents
⚠️ This page may combine multiple inventors who share the name “OHTA MITSUYASU”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
MATSUSHITA ELECTRIC INDUSTRIAL CO LTD
18 patentsUS6734549B2May 11, 2004
Semiconductor device having a device for testing the semiconductor
MATSUSHITA ELECTRIC INDUSTRIAL CO LTD39 citations96
US6625784B1Sep 23, 2003
Semiconductor integrated circuit device, method of testing the same, database for design of the same and method of designing the same
MATSUSHITA ELECTRIC INDUSTRIAL CO LTD46 citations96
US6119250ASep 12, 2000
Semiconductor integrated circuit
MATSUSHITA ELECTRIC INDUSTRIAL CO LTD71 citations96
US7032196B2Apr 18, 2006
Semiconductor wiring substrate, semiconductor device, method for testing semiconductor device, and method for mounting semiconductor device
MATSUSHITA ELECTRIC INDUSTRIAL CO LTD15 citations92
US6499125B1Dec 24, 2002
Method for inserting test circuit and method for converting test data
MATSUSHITA ELECTRIC INDUSTRIAL CO LTD18 citations84
US7197725B2Mar 27, 2007
Semiconductor integrated circuit and testing method for the same
MATSUSHITA ELECTRIC INDUSTRIAL CO LTD13 citations83
US6615389B1Sep 2, 2003
Database for designing integrated circuit device, and method for designing integrated circuit device
MATSUSHITA ELECTRIC INDUSTRIAL CO LTD6 citations74
US7348595B2Mar 25, 2008
Semiconductor wiring substrate, semiconductor device, method for testing semiconductor device, and method for mounting semiconductor device
MATSUSHITA ELECTRIC INDUSTRIAL CO LTD4 citations73
US7171600B2Jan 30, 2007
Semiconductor wiring substrate, semiconductor device, method for testing semiconductor device, and method for mounting semiconductor device
MATSUSHITA ELECTRIC INDUSTRIAL CO LTD4 citations73
US6651206B2Nov 18, 2003
Method of design for testability, test sequence generation method and semiconductor integrated circuit
MATSUSHITA ELECTRIC INDUSTRIAL CO LTD5 citations73
US5978948ANov 2, 1999
Semiconductor circuit system, method for testing semiconductor integrated circuits, and method for generating a test sequence for testing thereof
MATSUSHITA ELECTRIC INDUSTRIAL CO LTD14 citations73
US5305328AApr 19, 1994
Method of test sequence generation
MATSUSHITA ELECTRIC INDUSTRIAL CO LTD19 citations73
US6708301B1Mar 16, 2004
Functional block for integrated circuit, semiconductor integrated circuit, inspection method for semiconductor integrated circuit, and designing method therefor
MATSUSHITA ELECTRIC INDUSTRIAL CO LTD12 citations71
US7302658B2Nov 27, 2007
Methods for evaluating quality of test sequences for delay faults and related technology
MATSUSHITA ELECTRIC INDUSTRIAL CO LTD2 citations62
US7203913B2Apr 10, 2007
Semiconductor integrated circuit device, method of testing the same, database for design of the same and method of designing the same
MATSUSHITA ELECTRIC INDUSTRIAL CO LTD2 citations62
US6271677B1Aug 7, 2001
Semiconductor integrated circuit and method for testing the semiconductor integrated circuit
MATSUSHITA ELECTRIC INDUSTRIAL CO LTD2 citations62
US6253343B1Jun 26, 2001
Method of design for testability test sequence generation method and semiconductor integrated circuit
MATSUSHITA ELECTRIC INDUSTRIAL CO LTD4 citations62
US5483543AJan 9, 1996
Test sequence generation method
MATSUSHITA ELECTRIC INDUSTRIAL CO LTD5 citations62