Inventor
YOSHIMURA MASAYOSHI
JP20 patents
⚠️ This page may combine multiple inventors who share the name “YOSHIMURA MASAYOSHI”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
HITACHI LTD
14 patentsUS4095253AJun 13, 1978
Single in-line high power resin-packaged semiconductor device having an improved heat dissipator
HITACHI LTD33 citations91
US4689503AAug 25, 1987
Level conversion circuitry for a semiconductor integrated circuit utilizing bis CMOS circuit elements
HITACHI LTD16 citations82
US4056413ANov 1, 1977
Etching method for flattening a silicon substrate utilizing an anisotropic alkali etchant
HITACHI LTD26 citations82
US3990092ANov 2, 1976
Resistance element for semiconductor integrated circuit
HITACHI LTD22 citations82
US5245224ASep 14, 1993
Level conversion circuitry for a semiconductor integrated circuit
HITACHI LTD17 citations73
US4983862AJan 8, 1991
Semiconductor integrated circuit with a bi-MOS input circuit for providing input signals to an internal logic block
HITACHI LTD5 citations73
US4021687AMay 3, 1977
Transistor circuit for deep saturation prevention
HITACHI LTD14 citations73
US4423433ADec 27, 1983
High-breakdown-voltage resistance element for integrated circuit with a plurality of multilayer, overlapping electrodes
HITACHI LTD15 citations72
US4879480ANov 7, 1989
Bicmos gate array
HITACHI LTD4 citations71
US5103120AApr 7, 1992
Level conversion circuitry for a semiconductor integrated circuit
HITACHI LTD2 citations62
US4024568AMay 17, 1977
Transistor with base/emitter encirclement configuration
HITACHI LTD4 citations62
US4443812AApr 17, 1984
High-breakdown-voltage semiconductor device
HITACHI LTD2 citations61
US5495183AFeb 27, 1996
Level conversion circuitry for a semiconductor integrated circuit
HITACHI LTD2 citations60
US5512847AApr 30, 1996
BiCMOS tri-state output driver
HITACHI LTD0 citations52
MATSUSHITA ELECTRIC INDUSTRIAL CO LTD
6 patentsUS6734549B2May 11, 2004
Semiconductor device having a device for testing the semiconductor
MATSUSHITA ELECTRIC INDUSTRIAL CO LTD39 citations96
US7032196B2Apr 18, 2006
Semiconductor wiring substrate, semiconductor device, method for testing semiconductor device, and method for mounting semiconductor device
MATSUSHITA ELECTRIC INDUSTRIAL CO LTD15 citations92
US7197725B2Mar 27, 2007
Semiconductor integrated circuit and testing method for the same
MATSUSHITA ELECTRIC INDUSTRIAL CO LTD13 citations83
US7348595B2Mar 25, 2008
Semiconductor wiring substrate, semiconductor device, method for testing semiconductor device, and method for mounting semiconductor device
MATSUSHITA ELECTRIC INDUSTRIAL CO LTD4 citations73
US7171600B2Jan 30, 2007
Semiconductor wiring substrate, semiconductor device, method for testing semiconductor device, and method for mounting semiconductor device
MATSUSHITA ELECTRIC INDUSTRIAL CO LTD4 citations73
US6708315B2Mar 16, 2004
Method of design for testability, method of design for integrated circuits and integrated circuits
MATSUSHITA ELECTRIC INDUSTRIAL CO LTD6 citations62