Inventor · disambiguated record
Hee-Wook You
Also filed as: YOU HEE-WOOK
9 granted patents·1 pending application·17 citations·filing 2008–2018
82Inventor score
Top patents by PatentIndex Score
10 records- 0182US10468415B2Semiconductor device and semiconductor package including the sameSAMSUNG ELECTRONICS CO LTD·Filed 2017·Granted Nov 5, 2019·4 cites·20 claims
- 0272US8878929B2Three dimensional shape measurement apparatus and methodKIM HO·Filed 2010·Granted Nov 4, 2014·5 cites·5 claims
- 0367US9885669B2Method of inspecting a substrateCHO SOO YOUNG·Filed 2011·Granted Feb 6, 2018·3 cites·22 claims
- 0466US10060859B2Method of inspecting foreign substance on substrateKOH YOUNG TECH INC·Filed 2014·Granted Aug 28, 2018·2 cites·12 claims
- 0563US9124810B2Method of checking an inspection apparatus and method of establishing a measurement variable of the inspection apparatusYOU HEE-WOOK·Filed 2011·Granted Sep 1, 2015·2 cites·8 claims
- 0660US9256912B2Method of measuring measurement targetJEONG JOONG-KI·Filed 2010·Granted Feb 9, 2016·1 cites·5 claims
- 0754US10705028B2Method of inspecting foreign substance on substrateKOH YOUNG TECH INC·Filed 2018·Granted Jul 7, 2020·0 cites·8 claims
- 0850US8644590B2Method of measuring measurement targetJEONG JOONG-KI·Filed 2012·Granted Feb 4, 2014·0 cites·10 claims
- 0950US2014010438A1Three dimensional shape measurement apparatus and methodKOH YOUNG TECH INC·Filed 2013·Application pending·0 cites
- 1049US8116555B2Vision inspection system and method for inspecting workpiece using the sameAHN WOO JUNG·Filed 2008·Granted Feb 14, 2012·0 cites·18 claims
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