Inventor
SHEPARD JR JOSEPH F
US40 patents
⚠️ This page may combine multiple inventors who share the name “SHEPARD JR JOSEPH F”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
IBM
26 patentsUS7170164B2Jan 30, 2007
Cooling system for a semiconductor device and method of fabricating same
IBM91 citations98
US7030481B2Apr 18, 2006
High density chip carrier with integrated passive devices
IBM401 citations98
US7029951B2Apr 18, 2006
Cooling system for a semiconductor device and method of fabricating same
IBM97 citations98
US6962872B2Nov 8, 2005
High density chip carrier with integrated passive devices
IBM363 citations98
US6268299B1Jul 31, 2001
Variable stoichiometry silicon nitride barrier films for tunable etch selectivity and enhanced hyrogen permeability
IBM78 citations96
US7186625B2Mar 6, 2007
High density MIMCAP with a unit repeatable structure
IBM23 citations93
US6909145B2Jun 21, 2005
Metal spacer gate for CMOS FET
IBM21 citations93
US6563160B2May 13, 2003
High dielectric constant materials forming components of DRAM such as deep-trench capacitors and gate dielectric (insulators) for support circuits
IBM33 citations93
US6509612B2Jan 21, 2003
High dielectric constant materials as gate dielectrics (insulators)
IBM19 citations93
US6441421B1Aug 27, 2002
High dielectric constant materials forming components of DRAM storage cells
IBM31 citations93
US6936512B2Aug 30, 2005
Semiconductor method and structure for simultaneously forming a trench capacitor dielectric and trench sidewall device dielectric
IBM23 citations92
US6664161B2Dec 16, 2003
Method and structure for salicide trench capacitor plate electrode
IBM19 citations92
US6940117B2Sep 6, 2005
Prevention of Ta2O5 mim cap shorting in the beol anneal cycles
IBM13 citations84
US6794721B2Sep 21, 2004
Integration system via metal oxide conversion
IBM9 citations74
US6541331B2Apr 1, 2003
Method of manufacturing high dielectric constant material
IBM12 citations74
US9373501B2Jun 21, 2016
Hydroxyl group termination for nucleation of a dielectric metallic oxide
IBM3 citations73
US9059315B2Jun 16, 2015
Concurrently forming nFET and pFET gate dielectric layers
IBM2 citations63
US7528483B2May 5, 2009
Cooling system for a semiconductor device and method of fabricating same
IBM2 citations63
US7459913B2Dec 2, 2008
Methods for the determination of film continuity and growth modes in thin dielectric films
IBM2 citations63
US6933189B2Aug 23, 2005
Integration system via metal oxide conversion
IBM4 citations63
US6743670B2Jun 1, 2004
High dielectric constant materials forming components of DRAM such as deep-trench capacitors and gate dielectric (insulators) for support circuits
IBM2 citations63
US6652956B2Nov 25, 2003
X-ray printing personalization technique
IBM2 citations63
US9831084B2Nov 28, 2017
Hydroxyl group termination for nucleation of a dielectric metallic oxide
IBM0 citations52
US6653246B2Nov 25, 2003
High dielectric constant materials
IBM1 citations52
US6638681B2Oct 28, 2003
X-ray printing personalization technique
IBM0 citations52
US7871933B2Jan 18, 2011
Combined stepper and deposition tool
IBM0 citations42
GLOBALFOUNDRIES INC
6 patentsUS10211045B1Feb 19, 2019
Microwave annealing of flowable oxides with trap layers
GLOBALFOUNDRIES INC5 citations71
US10043753B2Aug 7, 2018
Airgaps to isolate metallization features
GLOBALFOUNDRIES INC0 citations51
US9257519B2Feb 9, 2016
Semiconductor device including graded gate stack, related method and design structure
GLOBALFOUNDRIES INC1 citations51
US9806161B1Oct 31, 2017
Integrated circuit structure having thin gate dielectric device and thick gate dielectric device
GLOBALFOUNDRIES INC1 citations50
US10355104B2Jul 16, 2019
Single-curvature cavity for semiconductor epitaxy
GLOBALFOUNDRIES INC0 citations49
US10192822B2Jan 29, 2019
Modified tungsten silicon
GLOBALFOUNDRIES INC0 citations40
CHUDZIK MICHAEL P
2 patentsUS8492290B2Jul 23, 2013
Fabrication of silicon oxide and oxynitride having sub-nanometer thickness
CHUDZIK MICHAEL P3 citations63
US9099461B2Aug 4, 2015
Method of manufacturing scaled equivalent oxide thickness gate stacks in semiconductor devices and related design structure
CHUDZIK MICHAEL P1 citations52