P

Inventor

SHEPARD JR JOSEPH F

US40 patents
⚠️ This page may combine multiple inventors who share the name “SHEPARD JR JOSEPH F”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

IBM

26 patents
US7170164B2Jan 30, 2007

Cooling system for a semiconductor device and method of fabricating same

IBM91 citations98
US7030481B2Apr 18, 2006

High density chip carrier with integrated passive devices

IBM401 citations98
US7029951B2Apr 18, 2006

Cooling system for a semiconductor device and method of fabricating same

IBM97 citations98
US6962872B2Nov 8, 2005

High density chip carrier with integrated passive devices

IBM363 citations98
US6268299B1Jul 31, 2001

Variable stoichiometry silicon nitride barrier films for tunable etch selectivity and enhanced hyrogen permeability

IBM78 citations96
US7186625B2Mar 6, 2007

High density MIMCAP with a unit repeatable structure

IBM23 citations93
US6909145B2Jun 21, 2005

Metal spacer gate for CMOS FET

IBM21 citations93
US6563160B2May 13, 2003

High dielectric constant materials forming components of DRAM such as deep-trench capacitors and gate dielectric (insulators) for support circuits

IBM33 citations93
US6509612B2Jan 21, 2003

High dielectric constant materials as gate dielectrics (insulators)

IBM19 citations93
US6441421B1Aug 27, 2002

High dielectric constant materials forming components of DRAM storage cells

IBM31 citations93
US6936512B2Aug 30, 2005

Semiconductor method and structure for simultaneously forming a trench capacitor dielectric and trench sidewall device dielectric

IBM23 citations92
US6664161B2Dec 16, 2003

Method and structure for salicide trench capacitor plate electrode

IBM19 citations92
US6940117B2Sep 6, 2005

Prevention of Ta2O5 mim cap shorting in the beol anneal cycles

IBM13 citations84
US6794721B2Sep 21, 2004

Integration system via metal oxide conversion

IBM9 citations74
US6541331B2Apr 1, 2003

Method of manufacturing high dielectric constant material

IBM12 citations74
US9373501B2Jun 21, 2016

Hydroxyl group termination for nucleation of a dielectric metallic oxide

IBM3 citations73
US9059315B2Jun 16, 2015

Concurrently forming nFET and pFET gate dielectric layers

IBM2 citations63
US7528483B2May 5, 2009

Cooling system for a semiconductor device and method of fabricating same

IBM2 citations63
US7459913B2Dec 2, 2008

Methods for the determination of film continuity and growth modes in thin dielectric films

IBM2 citations63
US6933189B2Aug 23, 2005

Integration system via metal oxide conversion

IBM4 citations63
US6743670B2Jun 1, 2004

High dielectric constant materials forming components of DRAM such as deep-trench capacitors and gate dielectric (insulators) for support circuits

IBM2 citations63
US6652956B2Nov 25, 2003

X-ray printing personalization technique

IBM2 citations63
US9831084B2Nov 28, 2017

Hydroxyl group termination for nucleation of a dielectric metallic oxide

IBM0 citations52
US6653246B2Nov 25, 2003

High dielectric constant materials

IBM1 citations52
US6638681B2Oct 28, 2003

X-ray printing personalization technique

IBM0 citations52
US7871933B2Jan 18, 2011

Combined stepper and deposition tool

IBM0 citations42

GLOBALFOUNDRIES INC

6 patents

CHUDZIK MICHAEL P

2 patents

INFINEON TECHNOLOGIES AG

1 patent

INFINEON TECHNOLOGIES CORP

1 patent

KRISHNAN RISHIKESH

1 patent

BRODSKY MARYJANE

1 patent

ANDREONI WANDA

1 patent

SHEPARD JR JOSEPH F

1 patent