P

Inventor

YIEH ELLIE

US90 patents
⚠️ This page may combine multiple inventors who share the name “YIEH ELLIE”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

APPLIED MATERIALS INC

47 patents
US7326657B2Feb 5, 2008

Post-deposition treatment to enhance properties of Si-O-C low k films

APPLIED MATERIALS INC524 citations99
US6635575B1Oct 21, 2003

Methods and apparatus to enhance properties of Si-O-C low K films

APPLIED MATERIALS INC150 citations99
US6632478B2Oct 14, 2003

Process for forming a low dielectric constant carbon-containing film

APPLIED MATERIALS INC658 citations99
US6627532B1Sep 30, 2003

Method of decreasing the K value in SiOC layer deposited by chemical vapor deposition

APPLIED MATERIALS INC358 citations99
US6593247B1Jul 15, 2003

Method of depositing low k films using an oxidizing plasma

APPLIED MATERIALS INC129 citations99
US6503843B1Jan 7, 2003

Multistep chamber cleaning and film deposition process using a remote plasma that also enhances film gap fill

APPLIED MATERIALS INC322 citations99
US6465366B1Oct 15, 2002

Dual frequency plasma enhanced chemical vapor deposition of silicon carbide layers

APPLIED MATERIALS INC315 citations99
US6413583B1Jul 2, 2002

Formation of a liquid-like silica layer by reaction of an organosilicon compound and a hydroxyl forming compound

APPLIED MATERIALS INC725 citations99
US6347636B1Feb 19, 2002

Methods and apparatus for gettering fluorine from chamber material surfaces

APPLIED MATERIALS INC579 citations99
US6114216ASep 5, 2000

Methods for shallow trench isolation

APPLIED MATERIALS INC230 citations99
US6110556AAug 29, 2000

Lid assembly for a process chamber employing asymmetric flow geometries

APPLIED MATERIALS INC218 citations99
US5963840AOct 5, 1999

Methods for depositing premetal dielectric layer at sub-atmospheric and high temperature conditions

APPLIED MATERIALS INC200 citations99
US5935340AAug 10, 1999

Method and apparatus for gettering fluorine from chamber material surfaces

APPLIED MATERIALS INC206 citations99
US5812403ASep 22, 1998

Methods and apparatus for cleaning surfaces in a substrate processing system

APPLIED MATERIALS INC459 citations99
US10923367B2Feb 16, 2021

Process chamber for etching low K and other dielectric films

APPLIED MATERIALS INC41 citations98
US7867923B2Jan 11, 2011

High quality silicon oxide films by remote plasma CVD from disilane precursors

APPLIED MATERIALS INC106 citations98
US6764958B1Jul 20, 2004

Method of depositing dielectric films

APPLIED MATERIALS INC314 citations98
US6602806B1Aug 5, 2003

Thermal CVD process for depositing a low dielectric constant carbon-doped silicon oxide film

APPLIED MATERIALS INC549 citations98
US6569257B1May 27, 2003

Method for cleaning a process chamber

APPLIED MATERIALS INC86 citations98
US6486082B1Nov 26, 2002

CVD plasma assisted lower dielectric constant sicoh film

APPLIED MATERIALS INC80 citations98
US6486061B1Nov 26, 2002

Post-deposition treatment to enhance properties of Si-O-C low K films

APPLIED MATERIALS INC83 citations98
US6465372B1Oct 15, 2002

Surface treatment of C-doped SiO2 film to enhance film stability during O2 ashing

APPLIED MATERIALS INC101 citations98
US6426015B1Jul 30, 2002

Method of reducing undesired etching of insulation due to elevated boron concentrations

APPLIED MATERIALS INC106 citations98
US6352591B1Mar 5, 2002

Methods and apparatus for shallow trench isolation

APPLIED MATERIALS INC112 citations98
US6117244ASep 12, 2000

Deposition resistant lining for CVD chamber

APPLIED MATERIALS INC93 citations98
US5994209ANov 30, 1999

Methods and apparatus for forming ultra-shallow doped regions using doped silicon oxide films

APPLIED MATERIALS INC161 citations98
US6890850B2May 10, 2005

Method of depositing dielectric materials in damascene applications

APPLIED MATERIALS INC92 citations97
US6374831B1Apr 23, 2002

Accelerated plasma clean

APPLIED MATERIALS INC642 citations97
US6583497B2Jun 24, 2003

Surface treatment of c-doped SiO2 film to enhance film stability during O2 ashing

APPLIED MATERIALS INC46 citations96
US6500773B1Dec 31, 2002

Method of depositing organosilicate layers

APPLIED MATERIALS INC63 citations96
US6348099B1Feb 19, 2002

Methods and apparatus for depositing premetal dielectric layer at sub-atmospheric and high temperature conditions

APPLIED MATERIALS INC71 citations96
US6153261ANov 28, 2000

Dielectric film deposition employing a bistertiarybutylaminesilane precursor

APPLIED MATERIALS INC62 citations96
US6121164ASep 19, 2000

Method for forming low compressive stress fluorinated ozone/TEOS oxide film

APPLIED MATERIALS INC59 citations96
US6218268B1Apr 17, 2001

Two-step borophosphosilicate glass deposition process and related devices and apparatus

APPLIED MATERIALS INC80 citations95
US6099647AAug 8, 2000

Methods and apparatus for forming ultra-shallow doped regions using doped silicon oxide films

APPLIED MATERIALS INC53 citations95
US5356722AOct 18, 1994

Method for depositing ozone/TEOS silicon oxide films of reduced surface sensitivity

APPLIED MATERIALS INC84 citations95
US7678662B2Mar 16, 2010

Memory cell having stressed layers

APPLIED MATERIALS INC22 citations93
US6531398B1Mar 11, 2003

Method of depositing organosillicate layers

APPLIED MATERIALS INC34 citations93
US6360685B1Mar 26, 2002

Sub-atmospheric chemical vapor deposition system with dopant bypass

APPLIED MATERIALS INC33 citations93
US6277200B2Aug 21, 2001

Dielectric film deposition employing a bistertiarybutylaminesilane precursor

APPLIED MATERIALS INC31 citations93
US5862057AJan 19, 1999

Method and apparatus for tuning a process recipe to target dopant concentrations in a doped layer

APPLIED MATERIALS INC41 citations93
US7160821B2Jan 9, 2007

Method of depositing low k films

APPLIED MATERIALS INC25 citations92
US7132369B2Nov 7, 2006

Method of forming a low-K dual damascene interconnect structure

APPLIED MATERIALS INC27 citations92
US7008484B2Mar 7, 2006

Method and apparatus for deposition of low dielectric constant materials

APPLIED MATERIALS INC19 citations92
US6858923B2Feb 22, 2005

Post-deposition treatment to enhance properties of Si-O-C low films

APPLIED MATERIALS INC17 citations92
US6815373B2Nov 9, 2004

Use of cyclic siloxanes for hardness improvement of low k dielectric films

APPLIED MATERIALS INC41 citations92
US6806207B2Oct 19, 2004

Method of depositing low K films

APPLIED MATERIALS INC34 citations92

MALLICK ABHIJIT BASU

1 patent

XIA LI-QUN

1 patent

LUBOMIRSKY DMITRY

1 patent

Showing the top 50 of 90 patents by PatentIndex Score.