Inventor
YIEH ELLIE
US90 patents
⚠️ This page may combine multiple inventors who share the name “YIEH ELLIE”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
APPLIED MATERIALS INC
47 patentsUS7326657B2Feb 5, 2008
Post-deposition treatment to enhance properties of Si-O-C low k films
APPLIED MATERIALS INC524 citations99
US6635575B1Oct 21, 2003
Methods and apparatus to enhance properties of Si-O-C low K films
APPLIED MATERIALS INC150 citations99
US6632478B2Oct 14, 2003
Process for forming a low dielectric constant carbon-containing film
APPLIED MATERIALS INC658 citations99
US6627532B1Sep 30, 2003
Method of decreasing the K value in SiOC layer deposited by chemical vapor deposition
APPLIED MATERIALS INC358 citations99
US6593247B1Jul 15, 2003
Method of depositing low k films using an oxidizing plasma
APPLIED MATERIALS INC129 citations99
US6503843B1Jan 7, 2003
Multistep chamber cleaning and film deposition process using a remote plasma that also enhances film gap fill
APPLIED MATERIALS INC322 citations99
US6465366B1Oct 15, 2002
Dual frequency plasma enhanced chemical vapor deposition of silicon carbide layers
APPLIED MATERIALS INC315 citations99
US6413583B1Jul 2, 2002
Formation of a liquid-like silica layer by reaction of an organosilicon compound and a hydroxyl forming compound
APPLIED MATERIALS INC725 citations99
US6347636B1Feb 19, 2002
Methods and apparatus for gettering fluorine from chamber material surfaces
APPLIED MATERIALS INC579 citations99
US6114216ASep 5, 2000
Methods for shallow trench isolation
APPLIED MATERIALS INC230 citations99
US6110556AAug 29, 2000
Lid assembly for a process chamber employing asymmetric flow geometries
APPLIED MATERIALS INC218 citations99
US5963840AOct 5, 1999
Methods for depositing premetal dielectric layer at sub-atmospheric and high temperature conditions
APPLIED MATERIALS INC200 citations99
US5935340AAug 10, 1999
Method and apparatus for gettering fluorine from chamber material surfaces
APPLIED MATERIALS INC206 citations99
US5812403ASep 22, 1998
Methods and apparatus for cleaning surfaces in a substrate processing system
APPLIED MATERIALS INC459 citations99
US10923367B2Feb 16, 2021
Process chamber for etching low K and other dielectric films
APPLIED MATERIALS INC41 citations98
US7867923B2Jan 11, 2011
High quality silicon oxide films by remote plasma CVD from disilane precursors
APPLIED MATERIALS INC106 citations98
US6764958B1Jul 20, 2004
Method of depositing dielectric films
APPLIED MATERIALS INC314 citations98
US6602806B1Aug 5, 2003
Thermal CVD process for depositing a low dielectric constant carbon-doped silicon oxide film
APPLIED MATERIALS INC549 citations98
US6569257B1May 27, 2003
Method for cleaning a process chamber
APPLIED MATERIALS INC86 citations98
US6486082B1Nov 26, 2002
CVD plasma assisted lower dielectric constant sicoh film
APPLIED MATERIALS INC80 citations98
US6486061B1Nov 26, 2002
Post-deposition treatment to enhance properties of Si-O-C low K films
APPLIED MATERIALS INC83 citations98
US6465372B1Oct 15, 2002
Surface treatment of C-doped SiO2 film to enhance film stability during O2 ashing
APPLIED MATERIALS INC101 citations98
US6426015B1Jul 30, 2002
Method of reducing undesired etching of insulation due to elevated boron concentrations
APPLIED MATERIALS INC106 citations98
US6352591B1Mar 5, 2002
Methods and apparatus for shallow trench isolation
APPLIED MATERIALS INC112 citations98
US6117244ASep 12, 2000
Deposition resistant lining for CVD chamber
APPLIED MATERIALS INC93 citations98
US5994209ANov 30, 1999
Methods and apparatus for forming ultra-shallow doped regions using doped silicon oxide films
APPLIED MATERIALS INC161 citations98
US6890850B2May 10, 2005
Method of depositing dielectric materials in damascene applications
APPLIED MATERIALS INC92 citations97
US6374831B1Apr 23, 2002
Accelerated plasma clean
APPLIED MATERIALS INC642 citations97
US6583497B2Jun 24, 2003
Surface treatment of c-doped SiO2 film to enhance film stability during O2 ashing
APPLIED MATERIALS INC46 citations96
US6500773B1Dec 31, 2002
Method of depositing organosilicate layers
APPLIED MATERIALS INC63 citations96
US6348099B1Feb 19, 2002
Methods and apparatus for depositing premetal dielectric layer at sub-atmospheric and high temperature conditions
APPLIED MATERIALS INC71 citations96
US6153261ANov 28, 2000
Dielectric film deposition employing a bistertiarybutylaminesilane precursor
APPLIED MATERIALS INC62 citations96
US6121164ASep 19, 2000
Method for forming low compressive stress fluorinated ozone/TEOS oxide film
APPLIED MATERIALS INC59 citations96
US6218268B1Apr 17, 2001
Two-step borophosphosilicate glass deposition process and related devices and apparatus
APPLIED MATERIALS INC80 citations95
US6099647AAug 8, 2000
Methods and apparatus for forming ultra-shallow doped regions using doped silicon oxide films
APPLIED MATERIALS INC53 citations95
US5356722AOct 18, 1994
Method for depositing ozone/TEOS silicon oxide films of reduced surface sensitivity
APPLIED MATERIALS INC84 citations95
US7678662B2Mar 16, 2010
Memory cell having stressed layers
APPLIED MATERIALS INC22 citations93
US6531398B1Mar 11, 2003
Method of depositing organosillicate layers
APPLIED MATERIALS INC34 citations93
US6360685B1Mar 26, 2002
Sub-atmospheric chemical vapor deposition system with dopant bypass
APPLIED MATERIALS INC33 citations93
US6277200B2Aug 21, 2001
Dielectric film deposition employing a bistertiarybutylaminesilane precursor
APPLIED MATERIALS INC31 citations93
US5862057AJan 19, 1999
Method and apparatus for tuning a process recipe to target dopant concentrations in a doped layer
APPLIED MATERIALS INC41 citations93
US7160821B2Jan 9, 2007
Method of depositing low k films
APPLIED MATERIALS INC25 citations92
US7132369B2Nov 7, 2006
Method of forming a low-K dual damascene interconnect structure
APPLIED MATERIALS INC27 citations92
US7008484B2Mar 7, 2006
Method and apparatus for deposition of low dielectric constant materials
APPLIED MATERIALS INC19 citations92
US6858923B2Feb 22, 2005
Post-deposition treatment to enhance properties of Si-O-C low films
APPLIED MATERIALS INC17 citations92
US6815373B2Nov 9, 2004
Use of cyclic siloxanes for hardness improvement of low k dielectric films
APPLIED MATERIALS INC41 citations92
US6806207B2Oct 19, 2004
Method of depositing low K films
APPLIED MATERIALS INC34 citations92
MALLICK ABHIJIT BASU
1 patentXIA LI-QUN
1 patentLUBOMIRSKY DMITRY
1 patentShowing the top 50 of 90 patents by PatentIndex Score.