Inventor

MILLER CHARLES A

US146 patents

⚠️ This page may combine multiple inventors who share the name “MILLER CHARLES A”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

MILLER CHARLES A

FORMFACTOR INC

Contactless interfacing of test signals with a device under test

Method for fabricating an IC interconnect system including an in-street integrated circuit wafer via

Probe card cooling assembly with direct cooling of active electronic components

Electromagnetically coupled interconnect system

Method of designing, fabricating, testing and interconnecting an IC to external circuit nodes

Adjustable delay transmission line

Integrated circuit tester with high bandwidth probe assembly

Integrated circuit interconnect system

Distributed interface for parallel testing of multiple devices using a single tester channel

Predictive, adaptive power supply for an integrated circuit under test

System for calibrating timing of an integrated circuit wafer tester

Method of designing, fabricating, testing and interconnecting an IC to external circuit nodes

Integrated circuit tester with high bandwidth probe assembly

Distributed interface for parallel testing of multiple devices using a single tester channel

Efficient parallel testing of integrated circuit devices using a known good device to generate expected responses

Apparatus for reducing power supply noise in an integrated circuit

High bandwidth passive integrated circuit tester probe card assembly

Filter structures for integrated circuit interfaces

Electromagnetically coupled interconnect system architecture

Electromagnetically coupled interconnect system architecture

Integrated circuit assembly

Apparatus for reducing power supply noise in an integrated circuit

Integrated circuit tester with high bandwidth probe assembly

Multiple die interconnect system

Integrated circuit interconnect system

Compensation for test signal degradation due to DUT fault

Tester channel to multiple IC terminals

Test signal distribution system for IC tester

Integrated circuit interconnect system

Cross-correlation timing calibration for wafer-level IC tester interconnect systems

Filter structures for integrated circuit interfaces

Efficient parallel testing of semiconductor devices using a known good device to generate expected responses

Parallel testing of integrated circuit devices using cross-DUT and within-DUT comparisons

Integrated circuit interconnect system forming a multi-pole filter

Apparatus for reducing power supply noise in an integrated circuit

Integrated circuit interconnect system

Closed-grid bus architecture for wafer interconnect structure

High frequency printed circuit board via

Closed-grid bus architecture for wafer interconnect structure

High performance probe system

High density planar electrical interface

High performance probe system

Predictive, adaptive power supply for an integrated circuit under test

Apparatus and method for electromechanical testing and validation of probe cards

Closed-grid bus architecture for wafer interconnect structure

High frequency printed circuit board via

ZUMBIEL C W CO

Contoured carton with dispenser

Sleeve style bottle carton

CREDENCE SYSTEMS CORP

Salphasic timing calibration system for an integrated circuit tester

Clock signal distribution system