Inventor
KADOTA KENICHI
JP15 patents
⚠️ This page may combine multiple inventors who share the name “KADOTA KENICHI”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
TOSHIBA KK
9 patentsUS7973281B2Jul 5, 2011
Semiconductor substrate, substrate inspection method, semiconductor device manufacturing method, and inspection apparatus
TOSHIBA KK57 citations96
US7573066B2Aug 11, 2009
Semiconductor substrate, substrate inspection method, semiconductor device manufacturing method, and inspection apparatus
TOSHIBA KK59 citations96
US7221991B2May 22, 2007
System and method for monitoring manufacturing apparatuses
TOSHIBA KK24 citations92
US7043384B2May 9, 2006
Failure detection system, failure detection method, and computer program product
TOSHIBA KK21 citations92
US7405088B2Jul 29, 2008
Method for analyzing fail bit maps of waters and apparatus therefor
TOSHIBA KK13 citations84
US7197414B2Mar 27, 2007
System and method for identifying a manufacturing tool causing a fault
TOSHIBA KK14 citations84
US7138283B2Nov 21, 2006
Method for analyzing fail bit maps of wafers
TOSHIBA KK12 citations84
US6975953B2Dec 13, 2005
Analysis method for semiconductor device, analysis system and a computer program product
TOSHIBA KK7 citations73
US7062409B2Jun 13, 2006
System for, method of and computer program product for detecting failure of manufacturing apparatuses
TOSHIBA KK5 citations62