Inventor
SUNAGA HIDEYUKI
JP6 patents
⚠️ This page may combine multiple inventors who share the name “SUNAGA HIDEYUKI”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
TOPCON CORP
5 patentsUS11754516B2Sep 12, 2023
Nondestructive test system comprising a neutron emission unit for emitting fast neutrons and a neutron detection unit for detecting thermal neutrons, and nondestructive test method
TOPCON CORP2 citations70
US11614415B2Mar 28, 2023
Nondestructive testing system and nondestructive testing method
TOPCON CORP5 citations70
US11513084B2Nov 29, 2022
Nondestructive inspecting system, and nondestructive inspecting method
TOPCON CORP4 citations69
US11747288B2Sep 5, 2023
Non-destructive inspection system comprising neutron radiation source and neutron radiation method
TOPCON CORP0 citations59
US11609190B2Mar 21, 2023
Non-destructive inspection method
TOPCON CORP0 citations56