Inventor
YASUZATO TADAO
JP23 patents
⚠️ This page may combine multiple inventors who share the name “YASUZATO TADAO”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
NEC CORP
14 patentsUS6355382B1Mar 12, 2002
Photomask and exposure method using a photomask
NEC CORP94 citations98
US5827623AOct 27, 1998
Optical proximity correction halftone type phase shift photomask
NEC CORP132 citations98
US5750290AMay 12, 1998
Photo mask and fabrication process therefor
NEC CORP49 citations96
US5060843AOct 29, 1991
Process of forming bump on electrode of semiconductor chip and apparatus used therefor
NEC CORP103 citations94
US6150059ANov 21, 2000
Photomask and method of exposure using same
NEC CORP32 citations92
US6004699ADec 21, 1999
Photomask used for projection exposure with phase shifted auxiliary pattern
NEC CORP40 citations92
US5644390AJul 1, 1997
Intensity distribution simulating method
NEC CORP52 citations92
US5439767AAug 8, 1995
Phase shift mask and its inspection method
NEC CORP22 citations92
US5792596AAug 11, 1998
Pattern forming method
NEC CORP33 citations89
US5935738AAug 10, 1999
Phase-shifting mask, exposure method and method for measuring amount of spherical aberration
NEC CORP12 citations74
US5908718AJun 1, 1999
Phase shifting photomask with two different transparent regions
NEC CORP15 citations74
US5636005AJun 3, 1997
Optical projection aligner equipped with rotatable fly-eye lens unit
NEC CORP16 citations74
US5619304AApr 8, 1997
Reduction exposure apparatus with improved resolution characteristic and raised light intensity
NEC CORP9 citations74
US5532497AJul 2, 1996
Optical aligner equipped with luminance sensor on movable stage
NEC CORP12 citations71
ELPIDA MEMORY INC
8 patentsUS7910266B2Mar 22, 2011
Pattern forming method and mask
ELPIDA MEMORY INC7 citations84
US8994151B2Mar 31, 2015
Semiconductor device having plural patterns extending in the same direction
ELPIDA MEMORY INC3 citations63
US7923179B2Apr 12, 2011
Exposure mask and pattern forming method therefor
ELPIDA MEMORY INC2 citations63
US7810066B2Oct 5, 2010
Irradiation pattern data generation method, mask fabrication method, and plotting system
ELPIDA MEMORY INC3 citations63
US7691543B2Apr 6, 2010
Mask data creation method
ELPIDA MEMORY INC2 citations63
US7681173B2Mar 16, 2010
Mask data generation method and mask
ELPIDA MEMORY INC3 citations57
US7632614B2Dec 15, 2009
Circuit pattern exposure method and mask
ELPIDA MEMORY INC2 citations57
US7955761B2Jun 7, 2011
Exposure mask, pattern formation method, and exposure mask fabrication method
ELPIDA MEMORY INC1 citations52