Inventor
CHANG YOUNG-UK
KR13 patents
⚠️ This page may combine multiple inventors who share the name “CHANG YOUNG-UK”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
SAMSUNG ELECTRONICS CO LTD
7 patentsUS7587645B2Sep 8, 2009
Input circuit of semiconductor memory device and test system having the same
SAMSUNG ELECTRONICS CO LTD12 citations83
US7673209B2Mar 2, 2010
Test pattern generating circuit and semiconductor memory device having the same
SAMSUNG ELECTRONICS CO LTD8 citations82
US7612578B2Nov 3, 2009
Semiconductor device, test system and method of testing on die termination circuit
SAMSUNG ELECTRONICS CO LTD10 citations81
US7130232B2Oct 31, 2006
Integrated circuit devices having multiple precharge circuits and methods of operating the same
SAMSUNG ELECTRONICS CO LTD8 citations73
US10115479B2Oct 30, 2018
Memory device, memory system and method of verifying repair result of memory device
SAMSUNG ELECTRONICS CO LTD5 citations72
US6822914B2Nov 23, 2004
Circuits and methods for generating high frequency extended test pattern data from low frequency test pattern data input to an integrated circuit memory device
SAMSUNG ELECTRONICS CO LTD4 citations61
US7334169B2Feb 19, 2008
Generation of test mode signals in memory device with minimized wiring
SAMSUNG ELECTRONICS CO LTD0 citations49
SILICON WORKS CO LTD
3 patentsUS10747360B2Aug 18, 2020
Display device and driver thereof
SILICON WORKS CO LTD4 citations71
US11222571B2Jan 11, 2022
Driving system for a double rate driving display
SILICON WORKS CO LTD0 citations62
US11222572B2Jan 11, 2022
Driving apparatus for double rate driving display
SILICON WORKS CO LTD0 citations62