Inventor

FEUERBAUM HANS-PETER

DE37 patents

⚠️ This page may combine multiple inventors who share the name “FEUERBAUM HANS-PETER”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

FEUERBAUM HANS-PETER

SIEMENS AG

Detector objective for particle beam apparatus

Spectrometer objective for particle beam measuring instruments

Scanning particle microscope

Method for measuring resistances and capacitances of electronic components

Techniques for impressing a voltage with an electron beam

Method for the contactless measurement of the potential waveform in an electronic component and arrangement for implementing the method

Spectrometer objective for electron beam mensuration techniques

Arrangement for stroboscopic potential measurements with an electron beam testing device

Method for the contactless measurement of the potential waveform in an electronic component and apparatus for implementing the method

Method and apparatus for locating defects in an electrical circuit with a light beam

Method and apparatus for suppressing disturbances in the measurement of signals with a particle probe

Secondary electron spectrometer for measuring voltages on a sample utilizing an electron probe

Electron beam testing device for stroboscopic measurement of high-frequency, periodic events

Apparatus for keying in electron beams

Method for automatically setting the voltage resolution in particle beam measuring devices and apparatus for implementation thereof

Method for automatically setting an operating point given signal curve measurements with a particle beam measuring apparatus

Particle-accelerating electrode

Method for representing logical status changes of a plurality of adjacent circuit nodes in an integrated circuit in a logic image employing a pulsed electron probe

INTEGRATED CIRCUIT TESTING

Charged particle beam apparatus and method for operating the same

Charged particle beam apparatus and method for operating the same

Multi beam charged particle device

Method of operating an electron beam measuring device

Apparatus and method for inspecting a sample of a specimen by means of an electron beam

Optical column for charged particle beam device

Charged particle device

Device for corpuscular-optical examination and/or processing of material samples

Focussing lens for charged particle beams

Imaging system with multi source array

Opposing field spectrometer for electron beam mensuration technology

APPLIED MATERIALS INC

Apparatus and method for examining specimen with a charged particle beam

Beam column for charged particle beam device

Charged particle beam microscope with minicolumn

Method and device for focusing a charged particle beam

Charged particle beam microscope with minicolumn

ACT ADVANCED CIRCUIT TESTING

Electrostatic-magnetic lens arrangement

EBETECH ELECTRON BEAM TECHNOLO

Method and apparatus for testing the function of microstructure elements

DEGENHARDT RALF

Charged particle beam device with retarding field analyzer