Inventor
MAGIA SAGAR
US19 patents
⚠️ This page may combine multiple inventors who share the name “MAGIA SAGAR”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
SANDISK TECHNOLOGIES INC
13 patentsUS9449698B1Sep 20, 2016
Block and zone erase algorithm for memory
SANDISK TECHNOLOGIES INC48 citations93
US9449694B2Sep 20, 2016
Non-volatile memory with multi-word line select for defect detection operations
SANDISK TECHNOLOGIES INC21 citations92
US9202593B1Dec 1, 2015
Techniques for detecting broken word lines in non-volatile memories
SANDISK TECHNOLOGIES INC21 citations92
US8710914B1Apr 29, 2014
Voltage regulators with improved wake-up response
SANDISK TECHNOLOGIES INC20 citations91
US9530514B1Dec 27, 2016
Select gate defect detection
SANDISK TECHNOLOGIES INC8 citations84
US9224502B1Dec 29, 2015
Techniques for detection and treating memory hole to local interconnect marginality defects
SANDISK TECHNOLOGIES INC15 citations84
US9548129B2Jan 17, 2017
Word line look ahead read for word line to word line short detection
SANDISK TECHNOLOGIES INC12 citations83
US9269446B1Feb 23, 2016
Methods to improve programming of slow cells
SANDISK TECHNOLOGIES INC13 citations83
US9240249B1Jan 19, 2016
AC stress methods to screen out bit line defects
SANDISK TECHNOLOGIES INC6 citations73
US9830998B2Nov 28, 2017
Stress patterns to detect shorts in three dimensional non-volatile memory
SANDISK TECHNOLOGIES INC2 citations72
US9564219B2Feb 7, 2017
Current based detection and recording of memory hole-interconnect spacing defects
SANDISK TECHNOLOGIES INC6 citations72
US9496040B2Nov 15, 2016
Adaptive multi-page programming methods and apparatus for non-volatile memory
SANDISK TECHNOLOGIES INC1 citations51
US9443612B2Sep 13, 2016
Determination of bit line to low voltage signal shorts
SANDISK TECHNOLOGIES INC1 citations42
SANDISK TECHNOLOGIES LLC
6 patentsUS9934872B2Apr 3, 2018
Erase stress and delta erase loop count methods for various fail modes in non-volatile memory
SANDISK TECHNOLOGIES LLC44 citations94
US10032524B2Jul 24, 2018
Techniques for determining local interconnect defects
SANDISK TECHNOLOGIES LLC8 citations84
US9653175B2May 16, 2017
Determination of word line to word line shorts between adjacent blocks
SANDISK TECHNOLOGIES LLC2 citations73
US9514835B2Dec 6, 2016
Determination of word line to word line shorts between adjacent blocks
SANDISK TECHNOLOGIES LLC1 citations52
US9484086B2Nov 1, 2016
Determination of word line to local source line shorts
SANDISK TECHNOLOGIES LLC1 citations42
US9460809B2Oct 4, 2016
AC stress mode to screen out word line to word line shorts
SANDISK TECHNOLOGIES LLC0 citations41