Inventor
SHEMESH DROR
IL30 patents
⚠️ This page may combine multiple inventors who share the name “SHEMESH DROR”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
APPLIED MATERIALS ISRAEL LTD
23 patentsUS7297965B2Nov 20, 2007
Method and apparatus for sample formation and microanalysis in a vacuum chamber
APPLIED MATERIALS ISRAEL LTD35 citations90
US9805909B1Oct 31, 2017
Method for detecting voids in interconnects and an inspection system
APPLIED MATERIALS ISRAEL LTD7 citations84
US7683317B2Mar 23, 2010
Method and system for detecting hidden defects
APPLIED MATERIALS ISRAEL LTD17 citations84
US7365320B2Apr 29, 2008
Methods and systems for process monitoring using x-ray emission
APPLIED MATERIALS ISRAEL LTD13 citations84
US7233008B1Jun 19, 2007
Multiple electrode lens arrangement and a method for inspecting an object
APPLIED MATERIALS ISRAEL LTD12 citations84
US9899185B1Feb 20, 2018
Resolving ambiguities in an energy spectrum
APPLIED MATERIALS ISRAEL LTD9 citations80
US7659506B2Feb 9, 2010
Method and system for generating and reviewing a thin sample
APPLIED MATERIALS ISRAEL LTD9 citations80
US7473911B2Jan 6, 2009
Specimen current mapper
APPLIED MATERIALS ISRAEL LTD8 citations79
US7271396B2Sep 18, 2007
Method and device for aligning a charged particle beam column
APPLIED MATERIALS ISRAEL LTD5 citations74
US11022565B2Jun 1, 2021
Process monitoring
APPLIED MATERIALS ISRAEL LTD4 citations69
US10347462B2Jul 9, 2019
Imaging of crystalline defects
APPLIED MATERIALS ISRAEL LTD2 citations69
US11423529B2Aug 23, 2022
Determination of defect location for examination of a specimen
APPLIED MATERIALS ISRAEL LTD2 citations68
US7847267B2Dec 7, 2010
Scanning electron microscope having multiple detectors and a method for multiple detector based imaging
APPLIED MATERIALS ISRAEL LTD4 citations63
US7312446B2Dec 25, 2007
Methods and systems for process monitoring using x-ray emission
APPLIED MATERIALS ISRAEL LTD2 citations63
US6894294B2May 17, 2005
System and method for reducing charged particle contamination
APPLIED MATERIALS ISRAEL LTD2 citations63
US11543368B2Jan 3, 2023
X-ray based evaluation of a status of a structure of a substrate
APPLIED MATERIALS ISRAEL LTD1 citations62
US10928336B1Feb 23, 2021
X-ray based evaluation of a status of a structure of a substrate
APPLIED MATERIALS ISRAEL LTD1 citations62
US12480898B2Nov 25, 2025
Z-profiling of wafers based on X-ray measurements
APPLIED MATERIALS ISRAEL LTD1 citations59
US7912657B2Mar 22, 2011
Method and system for providing a compensated auger spectrum
APPLIED MATERIALS ISRAEL LTD3 citations56
US6900065B2May 31, 2005
Apparatus and method for enhanced voltage contrast analysis
APPLIED MATERIALS ISRAEL LTD2 citations54
US9490101B2Nov 8, 2016
System and method for scanning an object
APPLIED MATERIALS ISRAEL LTD1 citations49
US11961221B2Apr 16, 2024
Defect examination on a semiconductor specimen
APPLIED MATERIALS ISRAEL LTD0 citations41
US8361814B2Jan 29, 2013
Method for monitoring chamber cleanliness
APPLIED MATERIALS ISRAEL LTD0 citations39
APPLIED MATERIALS INC
3 patentsUS6670610B2Dec 30, 2003
System and method for directing a miller
APPLIED MATERIALS INC58 citations94
US10922809B2Feb 16, 2021
Method for detecting voids and an inspection system
APPLIED MATERIALS INC2 citations68
US7161158B2Jan 9, 2007
System and method for fast focal length alterations
APPLIED MATERIALS INC4 citations60
INTEGRATED CIRCUIT TESTING
2 patentsUS7842930B2Nov 30, 2010
Charged particle detector assembly, charged particle beam apparatus and method for generating an image
INTEGRATED CIRCUIT TESTING1 citations52
US7838830B2Nov 23, 2010
Charged particle beam apparatus and method for operating a charged particle beam apparatus
INTEGRATED CIRCUIT TESTING1 citations51