P

Inventor

LANDIS HOWARD S

US44 patents
⚠️ This page may combine multiple inventors who share the name “LANDIS HOWARD S”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

IBM

36 patents
US5453639ASep 26, 1995

Planarized semiconductor structure using subminimum features

IBM54 citations96
US5292689AMar 8, 1994

Method for planarizing semiconductor structure using subminimum features

IBM82 citations96
US5036630AAug 6, 1991

Radial uniformity control of semiconductor wafer polishing

IBM107 citations96
US6495917B1Dec 17, 2002

Method and structure of column interconnect

IBM71 citations95
US5466636ANov 14, 1995

Method of forming borderless contacts using a removable mandrel

IBM63 citations95
US5539240AJul 23, 1996

Planarized semiconductor structure with subminimum features

IBM20 citations93
US7312141B2Dec 25, 2007

Shapes-based migration of aluminum designs to copper damascene

IBM14 citations92
US7015582B2Mar 21, 2006

Dummy metal fill shapes for improved reliability of hybrid oxide/low-k dielectrics

IBM15 citations92
US6559543B1May 6, 2003

Stacked fill structures for support of dielectric layers

IBM18 citations92
US6528883B1Mar 4, 2003

Shapes-based migration of aluminum designs to copper damascene

IBM31 citations92
US9170482B2Oct 27, 2015

Trimming of dummy fill shapes holes to affect near-neighbor dummy fill shapes with built-in optical proximity corrections for semiconductor applications

IBM8 citations84
US7888800B2Feb 15, 2011

Dummy metal fill shapes for improved reliability of hybrid oxide/low-k dielectrics

IBM9 citations84
US6992002B2Jan 31, 2006

Shapes-based migration of aluminum designs to copper damascence

IBM12 citations84
US7930667B2Apr 19, 2011

System and method of automated wire and via layout optimization description

IBM8 citations83
US7739632B2Jun 15, 2010

System and method of automated wire and via layout optimization description

IBM11 citations83
US7491578B1Feb 17, 2009

Method of forming crack trapping and arrest in thin film structures

IBM8 citations83
US7250363B2Jul 31, 2007

Aligned dummy metal fill and hole shapes

IBM13 citations83
US8839177B1Sep 16, 2014

Method and system allowing for semiconductor design rule optimization

IBM13 citations81
US6270353B1Aug 7, 2001

Low cost shallow trench isolation using non-conformal dielectric material

IBM16 citations79
US7269818B2Sep 11, 2007

Circuit element function matching despite auto-generated dummy shapes

IBM5 citations74
US6444581B1Sep 3, 2002

AB etch endpoint by ABFILL compensation

IBM9 citations71
US9977325B2May 22, 2018

Modifying design layer of integrated circuit (IC)

IBM2 citations67
US7886240B2Feb 8, 2011

Modifying layout of IC based on function of interconnect and related circuit and design structure

IBM3 citations63
US7721248B2May 18, 2010

Circuit element function matching despite auto-generated dummy shapes

IBM3 citations63
US7479701B2Jan 20, 2009

Dummy metal fill shapes for improved reliability of hybrid oxide/low-k dielectrics

IBM1 citations63
US6743710B2Jun 1, 2004

Stacked fill structures for support of dielectric layers

IBM4 citations63
US7861208B2Dec 28, 2010

Structure for partitioned dummy fill shapes for reduced mask bias with alternating phase shift masks

IBM2 citations62
US7709967B2May 4, 2010

Shapes-based migration of aluminum designs to copper damascene

IBM1 citations62
US7709300B2May 4, 2010

Structure and method for partitioned dummy fill shapes for reduced mask bias with alternating phase shift masks

IBM3 citations62
US7498250B2Mar 3, 2009

Shapes-based migration of aluminum designs to copper damascene

IBM2 citations62
US7573130B1Aug 11, 2009

Crack trapping and arrest in thin film structures

IBM5 citations61
US7689961B2Mar 30, 2010

Increased power line noise immunity in IC using capacitor structure in fill area

IBM4 citations60
US10254642B2Apr 9, 2019

Modifying design layer of integrated circuit (IC) using nested and non-nested fill objects

IBM1 citations56
US7537941B2May 26, 2009

Variable overlap of dummy shapes for improved rapid thermal anneal uniformity

IBM1 citations52
US7703053B2Apr 20, 2010

Regional pattern density determination method and system

IBM0 citations39
US7858269B2Dec 28, 2010

Structure and method for sub-resolution dummy clear shapes for improved gate dimensional control

IBM0 citations35

LANDIS HOWARD S

2 patents

BICKFORD JEANNE P

1 patent

COLLINS DAVID S

1 patent

GLOBALFOUNDRIES US INC

1 patent

BONILLA GRISELDA

1 patent

BURKHARDT MARTIN

1 patent

BASHABOINA PAVAN Y

1 patent