Inventor
LANDIS HOWARD S
US44 patents
⚠️ This page may combine multiple inventors who share the name “LANDIS HOWARD S”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
IBM
36 patentsUS5453639ASep 26, 1995
Planarized semiconductor structure using subminimum features
IBM54 citations96
US5292689AMar 8, 1994
Method for planarizing semiconductor structure using subminimum features
IBM82 citations96
US5036630AAug 6, 1991
Radial uniformity control of semiconductor wafer polishing
IBM107 citations96
US6495917B1Dec 17, 2002
Method and structure of column interconnect
IBM71 citations95
US5466636ANov 14, 1995
Method of forming borderless contacts using a removable mandrel
IBM63 citations95
US5539240AJul 23, 1996
Planarized semiconductor structure with subminimum features
IBM20 citations93
US7312141B2Dec 25, 2007
Shapes-based migration of aluminum designs to copper damascene
IBM14 citations92
US7015582B2Mar 21, 2006
Dummy metal fill shapes for improved reliability of hybrid oxide/low-k dielectrics
IBM15 citations92
US6559543B1May 6, 2003
Stacked fill structures for support of dielectric layers
IBM18 citations92
US6528883B1Mar 4, 2003
Shapes-based migration of aluminum designs to copper damascene
IBM31 citations92
US9170482B2Oct 27, 2015
Trimming of dummy fill shapes holes to affect near-neighbor dummy fill shapes with built-in optical proximity corrections for semiconductor applications
IBM8 citations84
US7888800B2Feb 15, 2011
Dummy metal fill shapes for improved reliability of hybrid oxide/low-k dielectrics
IBM9 citations84
US6992002B2Jan 31, 2006
Shapes-based migration of aluminum designs to copper damascence
IBM12 citations84
US7930667B2Apr 19, 2011
System and method of automated wire and via layout optimization description
IBM8 citations83
US7739632B2Jun 15, 2010
System and method of automated wire and via layout optimization description
IBM11 citations83
US7491578B1Feb 17, 2009
Method of forming crack trapping and arrest in thin film structures
IBM8 citations83
US7250363B2Jul 31, 2007
Aligned dummy metal fill and hole shapes
IBM13 citations83
US8839177B1Sep 16, 2014
Method and system allowing for semiconductor design rule optimization
IBM13 citations81
US6270353B1Aug 7, 2001
Low cost shallow trench isolation using non-conformal dielectric material
IBM16 citations79
US7269818B2Sep 11, 2007
Circuit element function matching despite auto-generated dummy shapes
IBM5 citations74
US6444581B1Sep 3, 2002
AB etch endpoint by ABFILL compensation
IBM9 citations71
US9977325B2May 22, 2018
Modifying design layer of integrated circuit (IC)
IBM2 citations67
US7886240B2Feb 8, 2011
Modifying layout of IC based on function of interconnect and related circuit and design structure
IBM3 citations63
US7721248B2May 18, 2010
Circuit element function matching despite auto-generated dummy shapes
IBM3 citations63
US7479701B2Jan 20, 2009
Dummy metal fill shapes for improved reliability of hybrid oxide/low-k dielectrics
IBM1 citations63
US6743710B2Jun 1, 2004
Stacked fill structures for support of dielectric layers
IBM4 citations63
US7861208B2Dec 28, 2010
Structure for partitioned dummy fill shapes for reduced mask bias with alternating phase shift masks
IBM2 citations62
US7709967B2May 4, 2010
Shapes-based migration of aluminum designs to copper damascene
IBM1 citations62
US7709300B2May 4, 2010
Structure and method for partitioned dummy fill shapes for reduced mask bias with alternating phase shift masks
IBM3 citations62
US7498250B2Mar 3, 2009
Shapes-based migration of aluminum designs to copper damascene
IBM2 citations62
US7573130B1Aug 11, 2009
Crack trapping and arrest in thin film structures
IBM5 citations61
US7689961B2Mar 30, 2010
Increased power line noise immunity in IC using capacitor structure in fill area
IBM4 citations60
US10254642B2Apr 9, 2019
Modifying design layer of integrated circuit (IC) using nested and non-nested fill objects
IBM1 citations56
US7537941B2May 26, 2009
Variable overlap of dummy shapes for improved rapid thermal anneal uniformity
IBM1 citations52
US7703053B2Apr 20, 2010
Regional pattern density determination method and system
IBM0 citations39
US7858269B2Dec 28, 2010
Structure and method for sub-resolution dummy clear shapes for improved gate dimensional control
IBM0 citations35