Inventor
NATSUMEDA MASANAO
JP28 patents
⚠️ This page may combine multiple inventors who share the name “NATSUMEDA MASANAO”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
NEC CORP
10 patentsUS9658916B2May 23, 2017
System analysis device, system analysis method and system analysis program
NEC CORP30 citations94
US10346758B2Jul 9, 2019
System analysis device and system analysis method
NEC CORP13 citations83
US10311172B2Jun 4, 2019
System analysis device and system analysis method
NEC CORP2 citations72
US9041041B2May 26, 2015
Optical device, optical element, and image display device
NEC CORP4 citations72
US10719577B2Jul 21, 2020
System analyzing device, system analyzing method and storage medium
NEC CORP1 citations62
US10719380B2Jul 21, 2020
Operation management apparatus, operation management method, and storage medium
NEC CORP1 citations61
US11755004B2Sep 12, 2023
Analysis system, analysis method, and storage medium
NEC CORP0 citations51
US11669771B2Jun 6, 2023
Learning system, analysis system, learning method, and storage medium
NEC CORP0 citations51
US11378944B2Jul 5, 2022
System analysis method, system analysis apparatus, and program
NEC CORP0 citations51
US10635765B2Apr 28, 2020
Cluster drawing on divided display region allocated to cluster
NEC CORP0 citations51
NEC LAB AMERICA INC
8 patentsUS11379284B2Jul 5, 2022
Topology-inspired neural network autoencoding for electronic system fault detection
NEC LAB AMERICA INC7 citations86
US11280816B2Mar 22, 2022
Detecting anomalies in a plurality of showcases
NEC LAB AMERICA INC3 citations73
US11204602B2Dec 21, 2021
Early anomaly prediction on multi-variate time series data
NEC LAB AMERICA INC5 citations73
US11675641B2Jun 13, 2023
Failure prediction
NEC LAB AMERICA INC1 citations62
US11604934B2Mar 14, 2023
Failure prediction using gradient-based sensor identification
NEC LAB AMERICA INC0 citations62
US11543561B2Jan 3, 2023
Root cause analysis for space weather events
NEC LAB AMERICA INC0 citations62
US12130616B2Oct 29, 2024
Approach to determining a remaining useful life of a system
NEC LAB AMERICA INC0 citations52
US11782812B2Oct 10, 2023
Causal attention-based multi-stream RNN for computer system metric prediction and influential events identification based on metric and event logs
NEC LAB AMERICA INC0 citations52
NATSUMEDA MASANAO
7 patentsUS9110357B2Aug 18, 2015
Display element, display device, and projection display device
NATSUMEDA MASANAO5 citations72
US9028071B2May 12, 2015
Light emitting element, light source device, and projection display device
NATSUMEDA MASANAO6 citations72
US9170351B2Oct 27, 2015
Optical element, light source apparatus, and projection-type display apparatus
NATSUMEDA MASANAO3 citations61
US9146350B2Sep 29, 2015
Optical element, light source device, and projection display device
NATSUMEDA MASANAO2 citations61
US9039201B2May 26, 2015
Display element, display device, and projection display device
NATSUMEDA MASANAO3 citations61
US9116270B2Aug 25, 2015
Optical element, light source device, and projection display device
NATSUMEDA MASANAO1 citations51
US9086619B2Jul 21, 2015
Optical device for projection display device having plasmons excited with fluorescence
NATSUMEDA MASANAO1 citations51
TOMINAGA SHIN
3 patentsUS8960915B2Feb 24, 2015
Optical element, light source device, and projection display device
TOMINAGA SHIN2 citations60
US8998420B2Apr 7, 2015
Optical element, light source device, and projection-type display device
TOMINAGA SHIN0 citations50
US8994055B2Mar 31, 2015
Light source and projection-type display device
TOMINAGA SHIN0 citations40