Inventor

HAQUE NAOSHIN

US3 patents

⚠️ This page may combine multiple inventors who share the name “HAQUE NAOSHIN”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

KLA TENCOR CORP

2 patents

US9518934B2Dec 13, 2016

Wafer defect discovery

KLA TENCOR CORP12 citations78

US10740888B2Aug 11, 2020

Computer assisted weak pattern detection and quantification system

KLA TENCOR CORP2 citations70

KLA CORP

1 patent

US11688052B2Jun 27, 2023

Computer assisted weak pattern detection and quantification system

KLA CORP0 citations60