P

Inventor

KAUSHIK NAVEEN

US15 patents

Patents

15 patents
US12137553B2Nov 5, 2024

Memory array and method used in forming a memory array

MICRON TECHNOLOGY INC3 citations73
US11456208B2Sep 27, 2022

Methods of forming apparatuses including air gaps between conductive lines and related apparatuses, memory devices, and electronic systems

MICRON TECHNOLOGY INC5 citations71
US12237259B2Feb 25, 2025

Electronic devices comprising multilevel bitlines, and related methods and systems

MICRON TECHNOLOGY INC0 citations62
US12154853B2Nov 26, 2024

Apparatuses including device structures including pillar structures

MICRON TECHNOLOGY INC0 citations62
US12068240B2Aug 20, 2024

Capacitor in a three-dimensional memory structure

MICRON TECHNOLOGY INC0 citations62
US11605588B2Mar 14, 2023

Memory device including data lines on multiple device levels

MICRON TECHNOLOGY INC1 citations62
US11605589B2Mar 14, 2023

Methods of forming microelectronic devices, and related microelectronic devices, memory devices, and electronic systems

MICRON TECHNOLOGY INC0 citations62
US11195560B2Dec 7, 2021

Integrated assemblies having void regions between digit lines and conductive structures, and methods of forming integrated assemblies

MICRON TECHNOLOGY INC0 citations62
US11728263B2Aug 15, 2023

Integrated assemblies having conductive-shield-structures between linear-conductive-structures

MICRON TECHNOLOGY INC0 citations61
US11302628B2Apr 12, 2022

Integrated assemblies having conductive-shield-structures between linear-conductive-structures

MICRON TECHNOLOGY INC0 citations61
US12593679B2Mar 31, 2026

Apparatuses and memory devices including air gaps between conductive lines

MICRON TECHNOLOGY INC0 citations60
US12389599B2Aug 12, 2025

Integrated assemblies and methods of forming integrated assemblies

MICRON TECHNOLOGY INC0 citations60
US12356617B2Jul 8, 2025

Microelectronic devices with vertically recessed channel structures and discrete, spaced inter-slit structures, and related methods and systems

MICRON TECHNOLOGY INC0 citations51
US12080756B2Sep 3, 2024

Altering breakdown voltages in gate devices and related methods and systems

MICRON TECHNOLOGY INC0 citations50
US11515311B2Nov 29, 2022

Semiconductor structure formation at differential depths

MICRON TECHNOLOGY INC0 citations47