Inventor
LEE HSIN-HUI
TW57 patents
⚠️ This page may combine multiple inventors who share the name “LEE HSIN-HUI”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
TAIWAN SEMICONDUCTOR MFG
33 patentsUS7361990B2Apr 22, 2008
Reducing cracking of high-lead or lead-free bumps by matching sizes of contact pads and bump pads
TAIWAN SEMICONDUCTOR MFG134 citations98
US7183137B2Feb 27, 2007
Method for dicing semiconductor wafers
TAIWAN SEMICONDUCTOR MFG102 citations98
US6743660B2Jun 1, 2004
Method of making a wafer level chip scale package
TAIWAN SEMICONDUCTOR MFG110 citations97
US6756294B1Jun 29, 2004
Method for improving bump reliability for flip chip devices
TAIWAN SEMICONDUCTOR MFG53 citations96
US9035445B2May 19, 2015
Seal ring structure with a metal pad
TAIWAN SEMICONDUCTOR MFG14 citations93
US8039315B2Oct 18, 2011
Thermally enhanced wafer level package
TAIWAN SEMICONDUCTOR MFG29 citations93
US7148560B2Dec 12, 2006
IC chip package structure and underfill process
TAIWAN SEMICONDUCTOR MFG45 citations93
US7112882B2Sep 26, 2006
Structures and methods for heat dissipation of semiconductor integrated circuits
TAIWAN SEMICONDUCTOR MFG30 citations93
US7294937B2Nov 13, 2007
Apparatus and method for manufacturing a semiconductor wafer with reduced delamination and peeling
TAIWAN SEMICONDUCTOR MFG26 citations92
US7265034B2Sep 4, 2007
Method of cutting integrated circuit chips from wafer by ablating with laser and cutting with saw blade
TAIWAN SEMICONDUCTOR MFG33 citations92
US7126225B2Oct 24, 2006
Apparatus and method for manufacturing a semiconductor wafer with reduced delamination and peeling
TAIWAN SEMICONDUCTOR MFG29 citations92
US6636313B2Oct 21, 2003
Method of measuring photoresist and bump misalignment
TAIWAN SEMICONDUCTOR MFG37 citations92
US6602775B1Aug 5, 2003
Method to improve reliability for flip-chip device for limiting pad design
TAIWAN SEMICONDUCTOR MFG29 citations92
US6805279B2Oct 19, 2004
Fluxless bumping process using ions
TAIWAN SEMICONDUCTOR MFG28 citations86
US7952167B2May 31, 2011
Scribe line layout design
TAIWAN SEMICONDUCTOR MFG12 citations84
US6974659B2Dec 13, 2005
Method of forming a solder ball using a thermally stable resinous protective layer
TAIWAN SEMICONDUCTOR MFG15 citations84
US6715524B2Apr 6, 2004
DFR laminating and film removing system
TAIWAN SEMICONDUCTOR MFG16 citations82
US7772691B2Aug 10, 2010
Thermally enhanced wafer level package
TAIWAN SEMICONDUCTOR MFG5 citations74
US7075016B2Jul 11, 2006
Underfilling efficiency by modifying the substrate design of flip chips
TAIWAN SEMICONDUCTOR MFG8 citations74
US7276454B2Oct 2, 2007
Application of impressed-current cathodic protection to prevent metal corrosion and oxidation
TAIWAN SEMICONDUCTOR MFG5 citations73
US7134199B2Nov 14, 2006
Fluxless bumping process
TAIWAN SEMICONDUCTOR MFG10 citations73
US7642631B2Jan 5, 2010
Packaged semiconductor chip comprising an integrated circuit chip ablated with laser and cut with saw blade from wafer
TAIWAN SEMICONDUCTOR MFG4 citations63
US7491624B2Feb 17, 2009
Method of manufacturing low CTE substrates for use with low-k flip-chip package devices
TAIWAN SEMICONDUCTOR MFG4 citations63
US7256071B2Aug 14, 2007
Underfilling efficiency by modifying the substrate design of flip chips
TAIWAN SEMICONDUCTOR MFG5 citations63
US7906425B2Mar 15, 2011
Fluxless bumping process
TAIWAN SEMICONDUCTOR MFG4 citations62
US7468321B2Dec 23, 2008
Application of impressed-current cathodic protection to prevent metal corrosion and oxidation
TAIWAN SEMICONDUCTOR MFG4 citations62
US6797075B2Sep 28, 2004
Ferris wheel-like stripping or cleaning mechanism for semiconductor fabrication
TAIWAN SEMICONDUCTOR MFG5 citations61
US7154185B2Dec 26, 2006
Encapsulation method for SBGA
TAIWAN SEMICONDUCTOR MFG6 citations60
US9064817B2Jun 23, 2015
Structure of wafer level chip molded package
TAIWAN SEMICONDUCTOR MFG0 citations52
US7170159B1Jan 30, 2007
Low CTE substrates for use with low-k flip-chip package devices
TAIWAN SEMICONDUCTOR MFG1 citations52
US7098082B2Aug 29, 2006
Microelectronics package assembly tool and method of manufacture therewith
TAIWAN SEMICONDUCTOR MFG0 citations52
US6802250B2Oct 12, 2004
Stencil design for solder paste printing
TAIWAN SEMICONDUCTOR MFG1 citations52
US7851272B2Dec 14, 2010
Multi-project wafer and method of making same
TAIWAN SEMICONDUCTOR MFG1 citations51
VANGUARD INT SEMICONDUCT CORP
12 patentsUS10651218B1May 12, 2020
Optical sensor structure and method for forming the same
VANGUARD INT SEMICONDUCT CORP4 citations72
US10699092B2Jun 30, 2020
Optical sensor and manufacturing method thereof
VANGUARD INT SEMICONDUCT CORP1 citations62
US11049771B2Jun 29, 2021
Semiconductor device and fingerprint identification device
VANGUARD INT SEMICONDUCT CORP0 citations61
US10915727B2Feb 9, 2021
Optical sensor and method for forming the same
VANGUARD INT SEMICONDUCT CORP0 citations61
US11989966B2May 21, 2024
Semiconductor devices and methods for forming the same
VANGUARD INT SEMICONDUCT CORP0 citations60
US11271024B2Mar 8, 2022
Semiconductor device and method for forming the same
VANGUARD INT SEMICONDUCT CORP0 citations60
US11177397B2Nov 16, 2021
Semiconductor devices and methods for forming the same
VANGUARD INT SEMICONDUCT CORP0 citations60
US11152422B2Oct 19, 2021
Semiconductor devices and methods for forming the same
VANGUARD INT SEMICONDUCT CORP0 citations60
US11315964B2Apr 26, 2022
Optical sensors and methods for forming the same
VANGUARD INT SEMICONDUCT CORP0 citations59
US10935805B2Mar 2, 2021
Optical sensor and method for forming the same
VANGUARD INT SEMICONDUCT CORP1 citations59
US11621287B2Apr 4, 2023
Optical sensor device with reduced thickness and method for forming the same
VANGUARD INT SEMICONDUCT CORP0 citations51
US11482552B2Oct 25, 2022
Semiconductor devices and methods for forming the same
VANGUARD INT SEMICONDUCT CORP0 citations51
LIN JENG-SHYAN
1 patentLEE HSIN-HUI
1 patentCHEN YEN-MING
1 patentLII MIRNG-JI
1 patentTAIWAN SEMICONDUCTOR MFG CO LTD
1 patentShowing the top 50 of 57 patents by PatentIndex Score.