Inventor
WONG JUSTIN W
US12 patents
⚠️ This page may combine multiple inventors who share the name “WONG JUSTIN W”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
IBM
11 patentsUS5582746ADec 10, 1996
Real time measurement of etch rate during a chemical etching process
IBM19 citations92
US5573624ANov 12, 1996
Chemical etch monitor for measuring film etching uniformity during a chemical etching process
IBM26 citations92
US5501766AMar 26, 1996
Minimizing overetch during a chemical etching process
IBM26 citations92
US5614247AMar 25, 1997
Apparatus for chemical vapor deposition of aluminum oxide
IBM32 citations91
US7793162B2Sep 7, 2010
Method for reporting the status and drill-down of a control application in an automated manufacturing environment
IBM29 citations90
US7493236B1Feb 17, 2009
Method for reporting the status of a control application in an automated manufacturing environment
IBM42 citations90
US7835814B2Nov 16, 2010
Tool for reporting the status and drill-down of a control application in an automated manufacturing environment
IBM11 citations82
US7805639B2Sep 28, 2010
Tool to report the status and drill-down of an application in an automated manufacturing environment
IBM15 citations82
US5500073AMar 19, 1996
Real time measurement of etch rate during a chemical etching process
IBM15 citations73
US5489361AFeb 6, 1996
Measuring film etching uniformity during a chemical etching process
IBM15 citations73
US5425810AJun 20, 1995
Removable gas injectors for use in chemical vapor deposition of aluminium oxide
IBM10 citations73