Inventor
DEBOE KENNETH W
US33 patents
⚠️ This page may combine multiple inventors who share the name “DEBOE KENNETH W”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
AEHR TEST SYSTEMS
27 patentsUS7762822B2Jul 27, 2010
Apparatus for testing electronic devices
AEHR TEST SYSTEMS29 citations96
US11255903B2Feb 22, 2022
Apparatus for testing electronic devices
AEHR TEST SYSTEMS12 citations93
US9316683B2Apr 19, 2016
Apparatus for testing electronic devices
AEHR TEST SYSTEMS19 citations92
US7667475B2Feb 23, 2010
Electronics tester with a signal distribution board and a wafer chuck having different coefficients of thermal expansion
AEHR TEST SYSTEMS16 citations92
US12292484B2May 6, 2025
Method and system for thermal control of devices in an electronics tester
AEHR TEST SYSTEMS1 citations75
US12007451B2Jun 11, 2024
Method and system for thermal control of devices in an electronics tester
AEHR TEST SYSTEMS2 citations73
US10649022B2May 12, 2020
Electronics tester
AEHR TEST SYSTEMS1 citations73
US10466292B2Nov 5, 2019
Method and system for thermal control of devices in an electronics tester
AEHR TEST SYSTEMS1 citations73
US9151797B2Oct 6, 2015
Apparatus for testing electronic devices
AEHR TEST SYSTEMS2 citations73
US8747123B2Jun 10, 2014
Apparatus for testing electronic devices
AEHR TEST SYSTEMS2 citations73
US12265136B2Apr 1, 2025
Method and system for thermal control of devices in electronics tester
AEHR TEST SYSTEMS0 citations62
US12169217B2Dec 17, 2024
Electronics tester
AEHR TEST SYSTEMS0 citations62
US12163999B2Dec 10, 2024
Apparatus for testing electronic devices
AEHR TEST SYSTEMS0 citations62
US11860221B2Jan 2, 2024
Apparatus for testing electronic devices
AEHR TEST SYSTEMS0 citations62
US11821940B2Nov 21, 2023
Electronics tester
AEHR TEST SYSTEMS0 citations62
US11635459B2Apr 25, 2023
Electronics tester
AEHR TEST SYSTEMS0 citations62
US11209497B2Dec 28, 2021
Method and system for thermal control of devices in an electronics tester
AEHR TEST SYSTEMS0 citations62
US11199572B2Dec 14, 2021
Electronics tester
AEHR TEST SYSTEMS0 citations62
US10976362B2Apr 13, 2021
Electronics tester with power saving state
AEHR TEST SYSTEMS0 citations62
US10852347B2Dec 1, 2020
Apparatus for testing electronic devices
AEHR TEST SYSTEMS0 citations62
US9291668B2Mar 22, 2016
Electronics tester with a valve integrally formed in a component of a portable pack
AEHR TEST SYSTEMS1 citations59
US10718808B2Jul 21, 2020
Electronics tester with current amplification
AEHR TEST SYSTEMS0 citations51
US10151793B2Dec 11, 2018
Electronics tester with double-spiral thermal control passage in a thermal chuck
AEHR TEST SYSTEMS0 citations51
US10094872B2Oct 9, 2018
Apparatus for testing electronic devices
AEHR TEST SYSTEMS0 citations51
US9857418B2Jan 2, 2018
Electronics tester with group and individual current configurations
AEHR TEST SYSTEMS0 citations51
US9500702B2Nov 22, 2016
Electronics tester with hot fluid thermal control
AEHR TEST SYSTEMS0 citations51
US7902846B2Mar 8, 2011
Electronics tester with a signal distribution board and a wafer chuck having different coefficients of thermal expansion
AEHR TEST SYSTEMS0 citations51
RICHMOND II DONALD P
4 patentsUS8628336B2Jan 14, 2014
Apparatus for testing electronic devices
RICHMOND II DONALD P26 citations95
US8506335B2Aug 13, 2013
Apparatus for testing electronic devices
RICHMOND II DONALD P31 citations95
US8388357B2Mar 5, 2013
Apparatus for testing electronic devices
RICHMOND II DONALD P12 citations91
US8118618B2Feb 21, 2012
Apparatus for testing electronic devices
RICHMOND II DONALD P13 citations91