Inventor
LINDSEY SCOTT E
US54 patents
⚠️ This page may combine multiple inventors who share the name “LINDSEY SCOTT E”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
AEHR TEST SYSTEMS
37 patentsUS7762822B2Jul 27, 2010
Apparatus for testing electronic devices
AEHR TEST SYSTEMS29 citations96
US8030957B2Oct 4, 2011
System for testing an integrated circuit of a device and its method of use
AEHR TEST SYSTEMS42 citations95
US11592465B2Feb 28, 2023
Pressure relief valve
AEHR TEST SYSTEMS13 citations93
US11255903B2Feb 22, 2022
Apparatus for testing electronic devices
AEHR TEST SYSTEMS12 citations93
US11112429B2Sep 7, 2021
Pressure relief valve
AEHR TEST SYSTEMS18 citations93
US10401385B2Sep 3, 2019
Limiting translation for consistent substrate-to-substrate contact
AEHR TEST SYSTEMS20 citations93
US9880197B2Jan 30, 2018
Controlling alignment during a thermal cycle
AEHR TEST SYSTEMS21 citations93
US9625521B2Apr 18, 2017
Controlling alignment during a thermal cycle
AEHR TEST SYSTEMS23 citations93
US9316683B2Apr 19, 2016
Apparatus for testing electronic devices
AEHR TEST SYSTEMS19 citations92
US7667475B2Feb 23, 2010
Electronics tester with a signal distribution board and a wafer chuck having different coefficients of thermal expansion
AEHR TEST SYSTEMS16 citations92
US11977098B2May 7, 2024
System for testing an integrated circuit of a device and its method of use
AEHR TEST SYSTEMS5 citations85
US7053644B1May 30, 2006
System for testing and burning in of integrated circuits
AEHR TEST SYSTEMS34 citations85
US11448695B2Sep 20, 2022
System for testing an integrated circuit of a device and its method of use
AEHR TEST SYSTEMS3 citations84
US10649022B2May 12, 2020
Electronics tester
AEHR TEST SYSTEMS1 citations73
USD850309SJun 4, 2019
Layout of contacts
AEHR TEST SYSTEMS4 citations73
US9151797B2Oct 6, 2015
Apparatus for testing electronic devices
AEHR TEST SYSTEMS2 citations73
US8747123B2Jun 10, 2014
Apparatus for testing electronic devices
AEHR TEST SYSTEMS2 citations73
USD629760SDec 28, 2010
Interface on an electronics connector
AEHR TEST SYSTEMS3 citations63
US12326472B2Jun 10, 2025
System for testing an integrated circuit of a device and its method of use
AEHR TEST SYSTEMS0 citations62
US12298328B2May 13, 2025
Controlling alignment during a thermal cycle
AEHR TEST SYSTEMS0 citations62
US12169217B2Dec 17, 2024
Electronics tester
AEHR TEST SYSTEMS0 citations62
US12163999B2Dec 10, 2024
Apparatus for testing electronic devices
AEHR TEST SYSTEMS0 citations62
US11860221B2Jan 2, 2024
Apparatus for testing electronic devices
AEHR TEST SYSTEMS0 citations62
US11821940B2Nov 21, 2023
Electronics tester
AEHR TEST SYSTEMS0 citations62
US11635459B2Apr 25, 2023
Electronics tester
AEHR TEST SYSTEMS0 citations62
US11199572B2Dec 14, 2021
Electronics tester
AEHR TEST SYSTEMS0 citations62
US10976362B2Apr 13, 2021
Electronics tester with power saving state
AEHR TEST SYSTEMS0 citations62
US10852347B2Dec 1, 2020
Apparatus for testing electronic devices
AEHR TEST SYSTEMS0 citations62
US9291668B2Mar 22, 2016
Electronics tester with a valve integrally formed in a component of a portable pack
AEHR TEST SYSTEMS1 citations59
US12584958B2Mar 24, 2026
Electronics tester
AEHR TEST SYSTEMS0 citations52
US10677843B2Jun 9, 2020
System for testing an integrated circuit of a device and its method of use
AEHR TEST SYSTEMS0 citations52
USD875579SFeb 18, 2020
Layout of contacts
AEHR TEST SYSTEMS0 citations52
USD630166SJan 4, 2011
Connector
AEHR TEST SYSTEMS0 citations52
US10718808B2Jul 21, 2020
Electronics tester with current amplification
AEHR TEST SYSTEMS0 citations51
US10151793B2Dec 11, 2018
Electronics tester with double-spiral thermal control passage in a thermal chuck
AEHR TEST SYSTEMS0 citations51
US10094872B2Oct 9, 2018
Apparatus for testing electronic devices
AEHR TEST SYSTEMS0 citations51
US9857418B2Jan 2, 2018
Electronics tester with group and individual current configurations
AEHR TEST SYSTEMS0 citations51
RICHMOND II DONALD P
4 patentsUS8628336B2Jan 14, 2014
Apparatus for testing electronic devices
RICHMOND II DONALD P26 citations95
US8506335B2Aug 13, 2013
Apparatus for testing electronic devices
RICHMOND II DONALD P31 citations95
US8388357B2Mar 5, 2013
Apparatus for testing electronic devices
RICHMOND II DONALD P12 citations91
US8118618B2Feb 21, 2012
Apparatus for testing electronic devices
RICHMOND II DONALD P13 citations91
MOTOROLA INC
3 patentsUS6310403B1Oct 30, 2001
Method of manufacturing components and component thereof
MOTOROLA INC60 citations95
US5773986AJun 30, 1998
Semiconductor wafer contact system and method for contacting a semiconductor wafer
MOTOROLA INC65 citations95
US5629630AMay 13, 1997
Semiconductor wafer contact system and method for contacting a semiconductor wafer
MOTOROLA INC54 citations95
LINDSEY SCOTT E
3 patentsUS9250291B2Feb 2, 2016
System for testing an integrated circuit of a device and its method of use
LINDSEY SCOTT E19 citations92
US8228085B2Jul 24, 2012
System for testing an integrated circuit of a device and its method of use
LINDSEY SCOTT E26 citations92
US8947116B2Feb 3, 2015
System for testing an integrated circuit of a device and its method of use
LINDSEY SCOTT E22 citations90
FORMFACTOR INC
2 patentsAEHR Test Ststems
1 patentShowing the top 50 of 54 patents by PatentIndex Score.