P

Inventor

BHATIA SIDHARTH

US27 patents
⚠️ This page may combine multiple inventors who share the name “BHATIA SIDHARTH”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

APPLIED MATERIALS INC

25 patents
USD1045924SOct 8, 2024

Portion of a display panel with a graphical user interface

APPLIED MATERIALS INC4 citations81
USD1031743SJun 18, 2024

Portion of a display panel with a graphical user interface

APPLIED MATERIALS INC5 citations81
US11328964B2May 10, 2022

Prescriptive analytics in highly collinear response space

APPLIED MATERIALS INC2 citations73
US10748797B2Aug 18, 2020

Plasma parameters and skew characterization by high speed imaging

APPLIED MATERIALS INC2 citations72
US11592812B2Feb 28, 2023

Sensor metrology data integration

APPLIED MATERIALS INC2 citations70
US11853042B2Dec 26, 2023

Part, sensor, and metrology data integration

APPLIED MATERIALS INC2 citations68
US12074073B2Aug 27, 2024

Prescriptive analytics in highly collinear response space

APPLIED MATERIALS INC0 citations62
US11545376B2Jan 3, 2023

Plasma parameters and skew characterization by high speed imaging

APPLIED MATERIALS INC0 citations61
US11495440B2Nov 8, 2022

Plasma density control on substrate edge

APPLIED MATERIALS INC0 citations61
US11120976B2Sep 14, 2021

Apparatus and methods for removing contaminant particles in a plasma process

APPLIED MATERIALS INC0 citations61
US12080519B2Sep 3, 2024

Smart dynamic load simulator for RF power delivery control system

APPLIED MATERIALS INC0 citations60
US12366853B2Jul 22, 2025

Sensor metrology data integration

APPLIED MATERIALS INC0 citations59
USD1045923SOct 8, 2024

Portion of a display panel with a graphical user interface

APPLIED MATERIALS INC0 citations58
US11829873B2Nov 28, 2023

Predictive modeling of a manufacturing process using a set of trained inverted models

APPLIED MATERIALS INC0 citations51
US10714319B2Jul 14, 2020

Apparatus and methods for removing contaminant particles in a plasma process

APPLIED MATERIALS INC0 citations51
US9589773B2Mar 7, 2017

In-situ etch rate determination for chamber clean endpoint

APPLIED MATERIALS INC1 citations51
US10790121B2Sep 29, 2020

Plasma density control on substrate edge

APPLIED MATERIALS INC0 citations50
US12560916B2Feb 24, 2026

Adjusting chamber performance by equipment constant updates

APPLIED MATERIALS INC0 citations49
US12504726B2Dec 23, 2025

Determining equipment constant updates by machine learning

APPLIED MATERIALS INC0 citations49
US12498705B2Dec 16, 2025

Chamber matching by equipment constant updates

APPLIED MATERIALS INC0 citations49
US11157661B2Oct 26, 2021

Process development visualization tool

APPLIED MATERIALS INC0 citations49
US12510878B2Dec 30, 2025

Physically-informed multi-system hardware operating windows

APPLIED MATERIALS INC0 citations47
US12469686B2Nov 11, 2025

Process characterization and correction using optical wall process sensor (OWPS)

APPLIED MATERIALS INC0 citations46
US12467136B2Nov 11, 2025

Process characterization and correction using optical wall process sensor (OWPS)

APPLIED MATERIALS INC0 citations44
US10755903B2Aug 25, 2020

RPS defect reduction by cyclic clean induced RPS cooling

APPLIED MATERIALS INC0 citations39

BHATIA SIDHARTH

2 patents