Inventor
KAWAMATA SHIGERU
JP19 patents
⚠️ This page may combine multiple inventors who share the name “KAWAMATA SHIGERU”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
HITACHI HIGH TECH CORP
12 patentsUS7705304B2Apr 27, 2010
Scanning electron microscope and three-dimensional shape measuring device that used it
HITACHI HIGH TECH CORP13 citations82
US10522325B2Dec 31, 2019
Charged particle beam device and image processing method in charged particle beam device
HITACHI HIGH TECH CORP2 citations71
US11321585B2May 3, 2022
Imaging device and morphological feature data display method
HITACHI HIGH TECH CORP2 citations68
US9202669B2Dec 1, 2015
Charged particle beam device and image display method for stereoscopic observation and stereoscopic display
HITACHI HIGH TECH CORP4 citations67
US11404242B2Aug 2, 2022
Charged particle beam device and method for setting condition in charged particle beam device
HITACHI HIGH TECH CORP1 citations59
US10763074B2Sep 1, 2020
Charged particle beam apparatus, observation method using charged particle beam apparatus, and program
HITACHI HIGH TECH CORP0 citations51
US10453650B2Oct 22, 2019
Charged particle beam apparatus, observation method using charged particle beam apparatus, and program
HITACHI HIGH TECH CORP0 citations51
US10763078B2Sep 1, 2020
Charged particle beam device and image processing method in charged particle beam device
HITACHI HIGH TECH CORP0 citations50
US9012842B2Apr 21, 2015
Charged particle beam device and inclined observation image display method
HITACHI HIGH TECH CORP1 citations49
US12215308B2Feb 4, 2025
Charged particle beam apparatus and cell evaluation method
HITACHI HIGH TECH CORP0 citations48
US11385193B2Jul 12, 2022
Imaging device
HITACHI HIGH TECH CORP0 citations47
US11239050B2Feb 1, 2022
Imaging device
HITACHI HIGH TECH CORP0 citations47