Inventor
HOSHINO YOSHINOBU
JP18 patents
⚠️ This page may combine multiple inventors who share the name “HOSHINO YOSHINOBU”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
HITACHI HIGH TECH CORP
12 patentsUS7705304B2Apr 27, 2010
Scanning electron microscope and three-dimensional shape measuring device that used it
HITACHI HIGH TECH CORP13 citations82
US10522325B2Dec 31, 2019
Charged particle beam device and image processing method in charged particle beam device
HITACHI HIGH TECH CORP2 citations71
US11538657B2Dec 27, 2022
Alignment system and seal for positional alignment
HITACHI HIGH TECH CORP2 citations63
US10763074B2Sep 1, 2020
Charged particle beam apparatus, observation method using charged particle beam apparatus, and program
HITACHI HIGH TECH CORP0 citations51
US10453650B2Oct 22, 2019
Charged particle beam apparatus, observation method using charged particle beam apparatus, and program
HITACHI HIGH TECH CORP0 citations51
US10763078B2Sep 1, 2020
Charged particle beam device and image processing method in charged particle beam device
HITACHI HIGH TECH CORP0 citations50
US12170183B2Dec 17, 2024
Charged particle microscope device and method for adjusting field-of-view thereof
HITACHI HIGH TECH CORP0 citations49
US11508047B2Nov 22, 2022
Charged particle microscope device and wide-field image generation method
HITACHI HIGH TECH CORP0 citations49
US11385193B2Jul 12, 2022
Imaging device
HITACHI HIGH TECH CORP0 citations47
US11239050B2Feb 1, 2022
Imaging device
HITACHI HIGH TECH CORP0 citations47
US12525424B2Jan 13, 2026
Charged particle beam apparatus and report creation method
HITACHI HIGH TECH CORP0 citations46
US10431417B2Oct 1, 2019
Charged particle beam device and sample holder
HITACHI HIGH TECH CORP0 citations41