Inventor
MURAOKA HISASHI
JP20 patents
⚠️ This page may combine multiple inventors who share the name “MURAOKA HISASHI”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
PUREX CO LTD
7 patentsUS5772738AJun 30, 1998
Multifunctional air filter and air-circulating clean unit with the same incorporated therein
PUREX CO LTD140 citations97
US5635463AJun 3, 1997
Silicon wafer cleaning fluid with HN03, HF, HCl, surfactant, and water
PUREX CO LTD60 citations96
US5681398AOct 28, 1997
Silicone wafer cleaning method
PUREX CO LTD28 citations92
US5350489ASep 27, 1994
Treatment method of cleaning surface of plastic molded item
PUREX CO LTD31 citations92
US5284802AFeb 8, 1994
Container for semiconductor wafer sample and method of preparing sample
PUREX CO LTD33 citations91
US5643404AJul 1, 1997
Method for examination of silicon wafer surface defects
PUREX CO LTD9 citations73
US6059887AMay 9, 2000
Process for cleaning the interior of semiconductor substrate
PUREX CO LTD1 citations52
TOKYO SHIBAURA ELECTRIC CO
5 patentsUS4339340AJul 13, 1982
Surface-treating agent adapted for intermediate products of a semiconductor device
TOKYO SHIBAURA ELECTRIC CO75 citations94
US4239661ADec 16, 1980
Surface-treating agent adapted for intermediate products of a semiconductor device
TOKYO SHIBAURA ELECTRIC CO96 citations94
US4172005AOct 23, 1979
Method of etching a semiconductor substrate
TOKYO SHIBAURA ELECTRIC CO44 citations91
US4095095AJun 13, 1978
Apparatus for manufacturing semiconductor devices
TOKYO SHIBAURA ELECTRIC CO36 citations86
US4587928AMay 13, 1986
Apparatus for producing a semiconductor device
TOKYO SHIBAURA ELECTRIC CO5 citations63
NOMURA MICRO SCIENCE KK
2 patentsTOSHIBA KK
2 patentsUS6054373AApr 25, 2000
Method of and apparatus for removing metallic impurities diffused in a semiconductor substrate
TOSHIBA KK24 citations92
US5636256AJun 3, 1997
Apparatus used for total reflection fluorescent X-ray analysis on a liquid drop-like sample containing very small amounts of impurities
TOSHIBA KK11 citations69