Inventor
PROBST KLAUS
DE5 patents
Patents
5 patentsUS6043667AMar 28, 2000
Substrate tester location clamping, sensing, and contacting method and apparatus
IBM122 citations95
US5221905AJun 22, 1993
Test system with reduced test contact interface resistance
IBM68 citations91
US5917329AJun 29, 1999
Substrate tester having shorting pad actuator method and apparatus
IBM30 citations90
US6005386ADec 21, 1999
Substrate tester method and apparatus having rotatable and infinitely adjustable locator jaws
IBM10 citations71
US6054863AApr 25, 2000
System for testing circuit board integrity
IBM15 citations69